We extended the bandwidth of a terahertz (THz) spectroscopic imaging system based on two-dimensional electro-optic sampling. By using an optical-rectification emitter, formed by a ZnTe crystal, a high-frequency component of more than 2.0THz was detected. A calibration-free procedure with polarity inversion of the THz beam ensures us precise spectroscopy: the polarity was inverted by rotating the emitter crystal. The spatial patterns of the chemicals were extracted from the THz multispectral images in the extended spectral region.

We demonstrate a method of chemical mapping by using the transillumination terahertz (THz) images obtained by two-dimensional electro-optic THz imaging. The images and spectral data were measured between 0.1 and 1.0 THz. An experimental sample consisting of three chemicals was prepared, with one in two concentrations. By introducing the component spatial pattern analysis based on the least-squares method, the chemical composition, spatial distribution, and difference in concentration were clearly determined.

We investigate triangular surface-relief gratings for reducing reflection at a planar silicon surface for light in the terahertz frequency region of 0.3-3.0THz. Structural parameters of the one- and two-dimensional (1D 2D) subwavelength gratings required for the antireflection (AR) layer were obtained numerically. Experimental results for the AR effects agreed well with those obtained numerically, except for gratings fabricated with laser ablation, which causes structural fluctuations of the grating. In the 1D grating, a high transmittance exceeding 90% for the TM wave was obtained. 2D gratings comprised of arrayed micropyramids were experimentally confirmed to be polarization insensitive.

No abstract

No abstract