This work investigates the anti-ice performance of various superhydrophobic surfaces under different conditions. The adhesion strength of glaze ice (similar to that deposited during "freezing rain") is used as a measure of ice-releasing properties. The results show that the ice-repellent properties of the materials deteriorate during icing/deicing cycles, as surface asperities appear to be gradually damaged. It is also shown that the anti-icing efficiency of superhydrophobic surfaces is significantly lower in a humid atmosphere, as water condensation both on top of and between surface asperities takes place, leading to significantly larger values of ice adhesion strength. This work thus shows that superhydrophobic surfaces are not always ice-repellent and their use as anti-ice materials may therefore be limited.

The authors demonstrate that the electric conductivities of cubic and hexagonal boron nitride (c-BN and h-BN) thin films increased markedly by the in situ doping of zinc. The doped films were electrically semiconducting, and conductivities at room temperature increased from 10−8to10−2Ω−1cm−1 with increasing zinc concentration from 400to20000ppm. Activation energies for electric conduction (Ec) of c-BN decreased from 0.3to0.1eV with increasing zinc concentration, suggesting feasible shallow-level doping. On the other hand, h-BN thin films showed approximately 0.1eV higher Ec than those of c-BN’s, due to the formation of defective B–B bonds.

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Epitaxial Ag(001) grown on MgO(001) and TiN(001): Twinning, surface morphology, and electron surface scatteringThe influence of Ti seed layers on the structure of self-organized Ag nanodots, obtained with a Ti seed-layer-assisted thermal agglomeration method, has been investigated. The samples were grown on MgO(001) single crystal substrates by RF magnetron sputter deposition. The samples were deposited at room temperature and post-annealed at 350 C for 4 h while maintaining the chamber vacuum conditions. The results of atomic force microscopy (AFM) observations indicated that the insertion of the Ti seed layer (0.6-5.0 nm) between the MgO substrate and Ag layer promotes the agglomeration process, forming the nanodot array. Comparisons between the AFM images revealed that the size of the Ag nanodots was increased with an increase in the Ti seed layer thickness. The atomic concentration of the film surface was confirmed by X-ray photoelectron spectroscopy (XPS). The XPS result suggested that the nanodot surface mainly consisted of Ag. Moreover, X-ray diffraction results proved that the initial deposition of the Ti seed layer (0.6-5.0 nm) onto MgO(001) prior to the Ag deposition yielded high-quality fcc-Ag(001) oriented epitaxial nanodots. The optical absorbance spectra of the fabricated Ag nanodots with various Ti seed layer thicknesses were obtained in the visible light range. V C 2013 AIP Publishing LLC.