In current systems, memory accesses to a DRAM chip must obey a set of minimum latency restrictions specified in the DRAM standard. Such timing parameters exist to guarantee reliable operation. When deciding the timing parameters, DRAM manufacturers incorporate a very large margin as a provision against two worst-case scenarios. First, due to process variation, some outlier chips are much slower than others and cannot be operated as fast. Second, chips become slower at higher temperatures, and all chips need to operate reliably at the highest supported (i.e., worst-case) DRAM temperature (85• C). In this paper, we show that typical DRAM chips operating at typical temperatures (e.g., 55• C) are capable of providing a much smaller access latency, but are nevertheless forced to operate at the largest latency of the worst-case.Our goal in this paper is to exploit the extra margin that is built into the DRAM timing parameters to improve performance. Using an FPGA-based testing platform, we first characterize the extra margin for 115 DRAM modules from three major manufacturers. Our results demonstrate that it is possible to reduce four of the most critical timing parameters by a minimum/maximum of 17.3%/54.8% at 55• C without sacrificing correctness. Based on this characterization, we propose Adaptive-Latency DRAM (AL-DRAM), a mechanism that adaptively reduces the timing parameters for DRAM modules based on the current operating condition. AL-DRAM does not require any changes to the DRAM chip or its interface.We evaluate AL-DRAM on a real system that allows us to reconfigure the timing parameters at runtime. We show that AL-DRAM improves the performance of memory-intensive workloads by an average of 14% without introducing any errors. We discuss and show why AL-DRAM does not compromise reliability. We conclude that dynamically optimizing the DRAM timing parameters can reliably improve system performance.

Being embedded in the physical world, sensor networks present a wide range of bugs and misbehavior qualitatively different from those in most distributed systems. Unfortunately, due to resource constraints, programmers must investigate these bugs with only limited visibility into the application. This paper presents the design and evaluation of Sympathy, a tool for detecting and debugging failures in sensor networks. Sympathy has selected metrics that enable efficient failure detection, and includes an algorithm that root-causes failures and localizes their sources in order to reduce overall failure notifications and point the user to a small number of probable causes. We describe Sympathy and evaluate its performance through fault injection and by debugging an active application, ESS, in simulation and deployment. We show that for a broad class of data gathering applications, it is possible to detect and diagnose failures by collecting and analyzing a minimal set of metrics at a centralized sink. We have found that there is a tradeoff between notification latency and detection accuracy; that additional metrics traffic does not always improve notification latency; and that Sympathy's process of failure localization reduces primary failure notifications by at least 50% in most cases.

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Modern DRAM cells are periodically refreshed to prevent data loss due to leakage. Commodity DDR (double data rate) DRAM refreshes cells at the rank level. This degrades performance significantly because it prevents an entire DRAM rank from serving memory requests while being refreshed. DRAM designed for mobile platforms, LPDDR (low power DDR) DRAM, supports an enhanced mode, called per-bank refresh, that refreshes cells at the bank level. This enables a bank to be accessed while another in the same rank is being refreshed, alleviating part of the negative performance impact of refreshes. Unfortunately, there are two shortcomings of per-bank refresh employed in today's systems. First, we observe that the perbank refresh scheduling scheme does not exploit the full potential of overlapping refreshes with accesses across banks because it restricts the banks to be refreshed in a sequential round-robin order. Second, accesses to a bank that is being refreshed have to wait.To mitigate the negative performance impact of DRAM refresh, we propose two complementary mechanisms, DARP (Dynamic Access Refresh Parallelization) and SARP (Subarray Access Refresh Parallelization). The goal is to address the drawbacks of per-bank refresh by building more efficient techniques to parallelize refreshes and accesses within DRAM. First, instead of issuing per-bank refreshes in a round-robin order, as it is done today, DARP issues per-bank refreshes to idle banks in an out-of-order manner. Furthermore, DARP proactively schedules refreshes during intervals when a batch of writes are draining to DRAM. Second, SARP exploits the existence of mostly-independent subarrays within a bank. With minor modifications to DRAM organization, it allows a bank to serve memory accesses to an idle subarray while another subarray is being refreshed. Extensive evaluations on a wide variety of workloads and systems show that our mechanisms improve system performance (and energy efficiency) compared to three state-of-the-art refresh policies and the performance benefit increases as DRAM density increases.

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