Fast digital timing simulations based on continuous-time, digital-value circuit models are an attractive and heavily used alternative to analog simulations. Models based on analytic delay formulas are particularly interesting here, as they also facilitate formal verification and delay bound synthesis of complex circuits. Recently, Függer et al. (arXiv:1406.2544) proposed a circuit model based on so-called involution channels. It is the first binary circuit model that realistically captures solvability of short-pulse filtration, a non-trivial glitch propagation problem related to building one-shot inertial delays.In this work, we address the question of whether involution channels also accurately model the delay of real circuits. Using both Spice simulations and physical measurements, we confirm that modeling an inverter chain by involution channels accurately describes reality. We also demonstrate that transitions in vanishing pulse trains are accurately predicted by the involution model. For our Spice simulations, we used both UMC-90 and UMC-65 technology, with varying supply voltages from nominal down to near sub-threshold range. The measurements were performed on a specialpurpose UMC-90 ASIC that combines an inverter chain with low-intrusive high-speed on-chip analog amplifiers.

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Single event transient (SET) pulse shapes caused by Au ions with an energy of 946 MeV were measured at the microprobe facility at GSI in Darmstadt. Using on-chip sense amplifiers, our novel approach allows observing SET pulse shapes at any interesting circuit node with negligible distortion. We were hence able to accurately trace the propagation of SET pulses through a 90 nm CMOS inverter chain.Index Terms-Analog on-chip measurement, heavy ions, microprobe, particle beams, position dependence, radiation effects in devices, radiation effects in ICs, sense amplifiers, single event effects, single event transient (SET), soft errors.

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/npsi/ctrl?lang=en http://nparc.cisti-icist.nrc-cnrc.gc.ca/npsi/ctrl?lang=fr READ THESE TERMS AND CONDITIONS CAREFULLY BEFORE USING THIS WEBSITE.http://nparc.cisti-icist.nrc-cnrc.gc.ca/npsi/jsp/nparc_cp.jsp?lang=en Vous avez des questions? Nous pouvons vous aider. Pour communiquer directement avec un auteur, consultez la première page de la revue dans laquelle son article a été publié afin de trouver ses coordonnées. Si vous n'arrivez pas à les repérer, communiquez avec nous à PublicationsArchive-ArchivesPublications@nrc-cnrc.gc.ca. Questions?Contact the NRC Publications Archive team at PublicationsArchive-ArchivesPublications@nrc-cnrc.gc.ca. If you wish to email the authors directly, please see the first page of the publication for their contact information. NRC Publications Archive Archives des publications du CNRCThis publication could be one of several versions: author's original, accepted manuscript or the publisher's version. / La version de cette publication peut être l'une des suivantes : la version prépublication de l'auteur, la version acceptée du manuscrit ou la version de l'éditeur. For the publisher's version, please access the DOI link below./ Pour consulter la version de l'éditeur, utilisez le lien DOI ci-dessous. This report provides the results of a key comparison, CCEM-K7, organised under the auspices of the Comité Consultatif d'Électricité et Magnétisme (CCEM) and carried out by a group of National Metrology Institutes (NMIs). The measured parameters were a set of ratios of a type of voltage transformer called an Inductive Voltage Divider (IVD). A single custom-made IVD -the Travelling Standard -was designed and used specifically for this comparison.