Position dependent measurement of single event transient voltage pulse shapes under heavy ion irradiation

Schweiger, Kurt; Hofbauer, Michael; Dietrich, H.; Zimmermann, Horst; Voss, Kay‐Obbe; Merk, Bruno

doi:10.1049/el.2011.3767

Cited by 7 publications

(5 citation statements)

References 6 publications

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“…A few papers also report on analog measurements of SET pulsewidths by directly connecting a real-time oscilloscope [51,56,49,36] . Our on-chip analog sense amplifiers [22] seem to be the first low-intrusive SET measurement attempt following the latter approach.…”

Section: Overview Of Set-related Researchmentioning

confidence: 99%

“…Since such information is usually only known to the manufacturer (and typically not disclosed to customers), the need arose to also calibrate and validate the 3D model. Rather than using transistor models provided in the manufacturer’s process design kits (PDK), as done in [38] , which are of questionable use for accurately calibrating the complex SET generation process, we conducted carefully controlled SET measurements [22] at the microprobe facility at the GSI [91] in Darmstadt (Germany) for this purpose. A microprobe facility allows a very accurate (sub-μm) deposition of single ions, with well-known energy, at any location on the chip.…”

Section: Fatal General Approachmentioning

confidence: 99%

“…3 for different impact positions of the ions. It is important to mention that the resulting SETs do not only depend on the impact position of the ion but also on the state of the circuit: For the two different inverter input levels, quite different behavior could be observed [22] : full-width half-maximum (fwhm) pulse widths of up to ∼1.6 ns for a low (0) input level, and up to ∼800 ps for a high (1) input level were observed, with very small rise times.…”

Section: Fatal General Approachmentioning

confidence: 99%

“… Measured SET voltage pulses (inverter) under heavy-ion ( 197 Au, 946 MeV) irradiation [22] : SETs for (a) low (0), (b) high (1) inputs. …”

Section: Figmentioning

confidence: 99%

“…Particle hits are incorporated via the SRIM–TRIM nuclear code simulation software [21] . In order to calibrate the 3D model, which obviously also depends on technology parameters like doping profiles, we manufactured our target circuits in 90 nm UMC CMOS technology and performed elaborate analog SET recording experiments under carefully controlled microbeam irradiation at the GSI in Darmstadt [22] .…”

Section: Introductionmentioning

confidence: 99%

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An infrastructure for accurate characterization of single-event transients in digital circuits

Veeravalli

Polzer

Schmid

et al. 2013

Microprocessors and Microsystems

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We present the architecture and a detailed pre-fabrication analysis of a digital measurement ASIC facilitating long-term irradiation experiments of basic asynchronous circuits, which also demonstrates the suitability of the general approach for obtaining accurate radiation failure models developed in our FATAL project. Our ASIC design combines radiation targets like Muller C-elements and elastic pipelines as well as standard combinational gates and flip-flops with an elaborate on-chip measurement infrastructure. Major architectural challenges result from the fact that the latter must operate reliably under the same radiation conditions the target circuits are exposed to, without wasting precious die area for a rad-hard design. A measurement architecture based on multiple non-rad-hard counters is used, which we show to be resilient against double faults, as well as many triple and even higher-multiplicity faults. The design evaluation is done by means of comprehensive fault injection experiments, which are based on detailed Spice models of the target circuits in conjunction with a standard double-exponential current injection model for single-event transients (SET). To be as accurate as possible, the parameters of this current model have been aligned with results obtained from 3D device simulation models, which have in turn been validated and calibrated using micro-beam radiation experiments at the GSI in Darmstadt, Germany. For the latter, target circuits instrumented with high-speed sense amplifiers have been used for analog SET recording. Together with a probabilistic analysis of the sustainable particle flow rates, based on a detailed area analysis and experimental cross-section data, we can conclude that the proposed architecture will indeed sustain significant target hit rates, without exceeding the resilience bound of the measurement infrastructure.

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Section: Overview Of Set-related Researchmentioning

confidence: 99%

Section: Fatal General Approachmentioning

confidence: 99%

Section: Fatal General Approachmentioning

confidence: 99%

“… Measured SET voltage pulses (inverter) under heavy-ion ( 197 Au, 946 MeV) irradiation [22] : SETs for (a) low (0), (b) high (1) inputs. …”

Section: Figmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%