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The electrochemical corrosion behavior and the semiconducting properties of the passive film formed on a coil spring steel were investigated in a buffer solution at pH 9. The anodic dissolution was mitigated, and the passive film grew faster for the spring steel with compressive residual stress than the one without stress. The passive films had an n-type semiconducting property with a high density of oxygen vacancy, and the defect density was lower for the specimens with compressive stress. The passive current density of the specimens with stress was higher and showed fluctuation. These characteristics imply that the growth mechanism of passive film and the transport of vacancies in the film on metals and alloys depend on the residual stress on the metallic surface.