We report on current-induced domain wall motion (CIDWM) in Ta\Co

Abstract-Electroencephalograph

The structural defects in two-dimensional transition metal dichalcogenides, including point defects, dislocations and grain boundaries, are scarcely considered regarding their potential to manipulate the electrical and optical properties of this class of materials, notwithstanding the significant advances already made. Indeed, impurities and vacancies may influence the exciton population, create disorder-induced localization, as well as modify the electrical behaviour of the material. Here we report on the experimental evidence, confirmed by ab initio calculations, that sulfur vacancies give rise to a novel near-infrared emission peak around 0.75 eV in exfoliated MoS2 flakes. In addition, we demonstrate an excess of sulfur vacancies at the flake's edges by means of cathodoluminescence mapping, aberration-corrected transmission electron microscopy imaging and electron energy loss analyses. Moreover, we show that ripplocations, extended line defects peculiar to this material, broaden and redshift the MoS2 indirect bandgap emission.

A model to compute the strain relaxation rate in InxGa1−xAs/GaAs single layers has been tested on several compositionally graded buffer layers. The existence of a critical elastic energy has been assumed as a criterion for the generation of new misfit dislocations. The surface strain accuracy results are within 2.5×10−4. The influence of different grading laws and growth conditions on residual strain, threading dislocation density, misfit dislocation confinement, and surface morphology has been studied. The probability of dislocation interaction and work hardening has been shown to strongly influence the mobility and the generation rate of the dislocations. Optimization of the growth conditions removes residual strain asymmetries and smoothes the surface roughness.

In this paper, we present a systematic study of the effect of growth parameters on the structural and optical properties of InAs quantum dot ͑QD͒ grown under Stranski-Krastanov mode by molecular beam epitaxy. The dot density is significantly reduced from 1.9ϫ10 10 to 0.6ϫ10 10 cm Ϫ2 as the growth rate decreases from 0.075 to 0.019 ML/s, while the island size becomes larger. Correspondingly, the emission wavelength shifts to the longer side. By increasing the indium fraction in the InGaAs capping layer, the emission wavelength increases further. At indium fraction of 0.3, a ground state transition wavelength as long as 1.4 m with the excited state transition wavelength of around 1.3 m has been achieved in our dots. The optical properties of QDs with a ground state transition wavelength of 1.3 m but with different growth techniques were compared. The QDs grown with higher rate and embedded by InGaAs have a higher intensity saturation level from excitation dependent photoluminescence measurements and a smaller intensity decrease from temperature dependent measurements. Finally, single mirror light emitting diodes with a QD embedded in InGaAs have been fabricated. The quantum efficiency at room temperature is 1.3%, corresponding to a radiative efficiency of 21.5%.