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We describe the design and performance of an orthogonal time-of-flight (TOF) secondary ion mass spectrometer that can be retrofitted to existing focused ion beam (FIB) instruments. In particular, a simple interface has been developed for FIB/SEM instruments from the manufacturer Tescan. Orthogonal extraction to the mass analyser obviates the need to pulse the primary ion beam and does not require the use of monoisotopic gallium to preserve mass resolution. The high-duty cycle and reasonable collection efficiency of the new instrument combined with the high spatial resolution of a gallium liquid metal ion source allow chemical observation of features smaller than 50 nm. We have also demonstrated the integration of a scanning probe microscope (SPM) operated as an atomic force microscope (AFM) within the FIB/SEM-SIMS chamber. This provides roughness information, and will also allow true three dimensional chemical images to be reconstructed from SIMS measurements.

Cerium 4f level occupation determines the properties of cerium oxide based catalysts in a significant way. The Ce 4f level of nanosized cerium oxide particles was investigated with the use of resonant photoelectron spectroscopy in the Ce 4d-4f photoabsorption region. A strong interaction of ceria with different additives, e.g. Pd and Sn, led to a partial Ce4+-->Ce3+ transition that was observed as a significant resonance enhancement of 4f photoemission intensity. Increases of the CO oxidation catalytic activity were observed simultaneously. The ratio of resonance enhancement of Ce photoemission intensity DCe(3+)/DCe(4+) was used to monitor Ce(3+) and Ce(4+) state occupation. The relative parameter DCe(3+)/DCe(4+) was found to be particularly useful in the case of photoemission studies of nanopowder ceria catalysts.

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