This paper presents some techniques to improve the linearity of traditional resistive feedback PGAs. By utilizing the switched op-amp in the PGA, the MOS switches in the feedback resistor array can be eliminated and thus the PGA’s linearity can be improved. The PGA’s linearity is further improved with an additional capacitor, which is used for pre-charging the sampling capacitor to strengthen its capability to drive the sampling capacitor without any extra power consumption. The pre-charge technique is especially suitable for the case where the PGA drives a large sampling capacitance. Implemented in SMIC 0.18 um CMOS technology, the proposed PGA can achieve a gain of 0.5 or 1 and consumes 4.68 mW at a single 5 V supply with the switched output stage enabled. When driving a 20 pF sampling capacitor at a sampling frequency of 200 kHz, the simulation results show that the proposed PGA can give a 9 dBc improvement in SFDR of the sampled signal compared to the traditional PGA design and the SFDR can reach up to 114 dBc.

This article presents an on-chip state-adjustable 8 GHz~12 GHz low-noise amplifier (LNA). It has two characteristics. First, an improved current reuse topology is proposed. By connecting a small capacitor in parallel with the drain of the first-stage transistor, the bandwidth is expanded and the in-band flatness is improved. Second, an innovative adaptive bias circuit is designed to cope with the influence of temperature and process on the performance of the amplifier, and a design method for on-chip adjustment of the chip state is proposed for the first time. As a result of these technologies, the chip area is 1.1 mm × 0.8 mm, the chip provides 24.4 dB nominal gain with merely 0.75 dB noise at 10 GHz, and yields 14.5 dBm output power at 1 dB compression point (OP1dB) when biased at 30 mA quiescent current, meanwhile, gain, OP1dB, and quiescent current can be adjusted on-chip. This design improves the comprehensive performance of X-band LNA and provides more flexibility for system engineers in application. The chip is fabricated using Win Semiconductors’ 0.15 um InGaAs pHEMT E-mode process.

This brief proposes a signal-independent background calibration in pipeline-SAR analog-to-digital converters (ADCs) with a convergence-accelerated technique. To achieve signal independence, an auxiliary capacitor array CA is introduced to pre-inject a pseudo-random noise (PN) in the sampling phase to cancel out the opposite PN injection of the calibrated capacitor in the conversion phase, and CA is also used to realize the D/A function of the calibrated capacitor in the conversion phase. In this way, no matter what the signal is, the residue headroom remains unchanged even with PN injection. Moreover, the first sub-ADC is designed with extended conversion bits to quantize its own residue after delivering the conversion bits required by the first stage. Afterwards, this result is provided to the calibration algorithm to reduce the signal component and accelerate the convergence. Based on the simulation, the signal-to-noise and distortion ratio (SNDR) and spur-free dynamic range (SFDR) improve from 45.3 dB and 56.4 dB to 68.2 dB and 88.4 dB, respectively, after calibration. In addition, with the acceleration technique, convergence cycles decrease from 1.7 × 108 to 5.8 × 106. Moreover, no matter whether the input signal is DC, sine wave or band-limited white noise, the calibration all works normally.