In the last ten to fifteen years there has been much research in using amorphous and polycrystalline semiconductors as x-ray photoconductors in various x-ray image sensor applications, most notably in flat panel x-ray imagers (FPXIs). We first outline the essential requirements for an ideal large area photoconductor for use in a FPXI, and discuss how some of the current amorphous and polycrystalline semiconductors fulfill these requirements. At present, only stabilized amorphous selenium (doped and alloyed a-Se) has been commercialized, and FPXIs based on a-Se are particularly suitable for mammography, operating at the ideal limit of high detective quantum efficiency (DQE). Further, these FPXIs can also be used in real-time, and have already been used in such applications as tomosynthesis. We discuss some of the important attributes of amorphous and polycrystalline x-ray photoconductors such as their large area deposition ability, charge collection efficiency, x-ray sensitivity, DQE, modulation transfer function (MTF) and the importance of the dark current. We show the importance of charge trapping in limiting not only the sensitivity but also the resolution of these detectors. Limitations on the maximum acceptable dark current and the corresponding charge collection efficiency jointly impose a practical constraint that many photoconductors fail to satisfy. We discuss the case of a-Se in which the dark current was brought down by three orders of magnitude by the use of special blocking layers to satisfy the dark current constraint. There are also a number of polycrystalline photoconductors, HgI2 and PbO being good examples, that show potential for commercialization in the same way that multilayer stabilized a-Se x-ray photoconductors were developed for commercial applications. We highlight the unique nature of avalanche multiplication in a-Se and how it has led to the development of the commercial HARP video-tube. An all solid state version of the HARP has been recently demonstrated with excellent avalanche gains; the latter is expected to lead to a number of novel imaging device applications that would be quantum noise limited. While passive pixel sensors use one TFT (thin film transistor) as a switch at the pixel, active pixel sensors (APSs) have two or more transistors and provide gain at the pixel level. The advantages of APS based x-ray imagers are also discussed with examples.

We describe the progress in the science and technology of stabilized a‐Se from its early use in xerography and xeroradiography to its present use in commercial modern flat panel X‐ray imagers and ultrasensitive video tubes which utilize impact ionization of drifting holes. Both electrons and holes can drift in stabilized a‐Se, which is a distinct advantage since X‐ray photogeneration of charge carriers occurs throughout the bulk of the photoconductive layer. An a‐Se photoconductor has to be operated at high fields to ensure that the photogeneration efficiency is sufficiently large to provide reasonable X‐ray sensitivity. However, at high fields, the dark current is unacceptably large in simple metal/a‐Se/metal devices, and special multilayer device structures need to be designed. The dark current decays with time and increases with the nominal applied field. The reduction of the dark current to a tolerable level was one of the key factors that lead to the commercialization of a‐Se X‐ray detectors. We discuss the origin of the dark current, and highlight some of the current challenges in the design of next generation detectors. We also discuss the origin of impact ionization in a‐Se, and its fruitful utilization in ultrasensitive imaging devices, including the Harpicon, which are likely to lead to new high detective quantum efficiency detectors.

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Because of uncertainties in manufacturing processes, a mechanical part always shows variations in its geometrical characteristics (ex. form, dimension, orientation and position). Quality then often reflect how well tolerances and hence, functional requirements, are being achieved by the manufacturing processes in the final product. From a design perspective, efficient methods must be made available to compute, from the tolerances on individual parts, the value of the functional requirement on the final assembly. This is known as tolerance analysis. To that end, existing methods, often based on modeling of the open kinematic chains in robotics, are classified as deterministic or statistical. These methods suppose that the assembled parts are not perfect with regard to the nominal geometry and are rigid. The rigidity of the parts implies that the places of contacts are regarded as points. The validation or the determination of a tolerance zone is therefore accomplished by a series of simulation in specific points subjected to assembly constraints. To overcome the limitations and difficulties of point based approaches, the paper proposes the unification of two existing models: the Jacobian’s matrix model, based on the infinitesimal modeling of open kinematic chains in robotics, and the tolerance zone representation model, using small displacement screws and constraints to establish the extreme limits between which points and surfaces can vary. The approach also uses interval algebra as a novel method to take tolerance boundaries into account in tolerance analysis. The approach has been illustrated on a simple two parts assembly, nevertheless demonstrating the capability of the method to handle three-dimensional geometry. The results are then validated geometrically, showing the overall soundness of the approach.

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