In the last decade, research on 2D materials has expanded massively due to the popularity of graphene. Although the chemical engineering of two-dimensional elemental materials as well as heterostructures has been extensively pursued, the fundamental understanding of the synthesis of 2D materials is not yet complete. Structural parameters, such as buckling or the interface structure of a 2D material to the substrate directly affect its electronic characteristics. In order to proceed the understanding of the element-specific growth and the associated ability of tuning material properties of two-dimensional materials, we performed a study on the structural evolution of the promising 2D material germanene on Ag(111). This study provides a survey of germanium formations at different layer thicknesses right up to the arising of quasi-freestanding germanene. Using powerful surface analysis tools like low-energy electron diffraction, x-ray photoelectron spectroscopy, and x-ray photoelectron diffraction with synchrotron radiation, we will reveal the internal and interfacial structure of all discovered germanium phases. Moreover, we will present models of the atomic and chemical structure of a $$\hbox {Ag}_2\hbox {Ge}$$ Ag 2 Ge surface alloy and the quasi-freestanding germanene with special focus on the structural parameters and electronic interaction at the interface.

The chemical and structural characteristics of a low-dimensional Au–Si surface alloy are presented in this work. Alloy formation was obtained by deposition of a sub-monolayer Si on Au(110). This preliminary phase to Si nano-ribbons is being investigated, as the transition from clean Au(110) to a silicon nano-ribbon coated surface is not yet understood. A multiple technique study has been carried out for detailed atomic structure determination and chemical investigation. Particular attention is paid to the clarification of the structural arrangement at the surface and at the interface. Using low-energy electron diffraction, the periodicity of the structure on long-range order could be examined. By means of high-precision photoemission measurements using synchrotron radiation, the electronic and atomic structure of the alloy can be presented. The investigation by photoelectron spectroscopy (XPS) using soft x-rays for a high surface sensitivity showed different chemical environments in the high-resolution spectra. The x-ray photoelectron diffraction (XPD) measurements, which are sensitive to the local atomic order, gave an approach to the structural configuration of the alloy. A new structural arrangement was found simulating both Au and Si XPD patterns. The results are compared to former proposed structure models. A deconvolution of the Si 2p XPD pattern revealed the origin of two chemically shifted XPS components.

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In this work, we present a structural investigation of sub-monolayer films of germanium on Ag(1 1 0) by means of photoelectron spectroscopy (XPS) and diffraction (XPD), as well as low-energy electron diffraction (LEED). Since the rising progress in the synthesis of various kinds of nanoribbons, also germanium nanoribbons (Ge-NR) have been synthesized on Ag(1 1 0), recently. Here, we focus on their structural evolution and found the formation of two different phases of germanium at coverages of $${0.5}\, \hbox {ML}$$ 0.5 ML and $${0.7}\,\hbox {ML}$$ 0.7 ML , differing fundamentally from predicted nanoribbon structures. By means of LEED measurements, we obtained evidence for germanium superstructures which are not aligned along the $$[{\overline{1}}\;1\;0]$$ [ 1 ¯ 1 0 ] -direction, as expected for nanoribbon growth. Using synchrotron-based high-resolution XPS and XPD experiments of the Ge 3d and Ag 3d core-levels, we resolved the local chemical and atomic order of the germanium films. Thus, the strong internal bonding of the buckled germanium film and a weak Van-der-Waals interaction between silver and germanium were discovered. Moreover, XPD-simulations delivered a detailed model of the structural arrangement of the preliminary nanoribbon phase, which also provided an approach to identify the origin of the two chemically shifted components in the Ge 3d signal by applying a component-wise decomposition of the XPD data.