2021
DOI: 10.1088/1361-648x/abfc16
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Surface and interface analysis of a low-dimensional Au–Si surface alloy on Au(110) by means of XPS and XPD

Abstract: The chemical and structural characteristics of a low-dimensional Au–Si surface alloy are presented in this work. Alloy formation was obtained by deposition of a sub-monolayer Si on Au(110). This preliminary phase to Si nano-ribbons is being investigated, as the transition from clean Au(110) to a silicon nano-ribbon coated surface is not yet understood. A multiple technique study has been carried out for detailed atomic structure determination and chemical investigation. Particular attention is paid to the clar… Show more

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Cited by 6 publications
(3 citation statements)
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“…By ratio of signal intensities from interacting atoms in spectra of Au 4 f and Si 2p, it is possible to assess ratio of gold and silicon atoms as 2 : 1. This correlates with the literature data on deposition of gold films on the silicon substrate [23][24][25][26][27], which show that when the gold films are deposited with thickness above 2 Å, the structural realignment of the interface takes place, which is accompanied by break of Si−Si bonds, formation of chemical bonds between Si and Au atoms and formation of region with mutual silicon and gold interdiffusion.…”
Section: Resultssupporting
confidence: 90%
“…By ratio of signal intensities from interacting atoms in spectra of Au 4 f and Si 2p, it is possible to assess ratio of gold and silicon atoms as 2 : 1. This correlates with the literature data on deposition of gold films on the silicon substrate [23][24][25][26][27], which show that when the gold films are deposited with thickness above 2 Å, the structural realignment of the interface takes place, which is accompanied by break of Si−Si bonds, formation of chemical bonds between Si and Au atoms and formation of region with mutual silicon and gold interdiffusion.…”
Section: Resultssupporting
confidence: 90%
“…130 The surface presents a reconstruction for which a model has been recently proposed on the basis of XPD results. 131…”
Section: Silicene On Other Substratesmentioning
confidence: 99%
“…# reconstruction for which a model has been recently proposed on the basis of XPD results. 131 These systems have been revisited in light of possible formation of silicene. On Au (110), STM observations showed that 0.3 ML Si deposition at 673 K leads to the formation of NRs of width equal to 1.6 nm.…”
Section: Silicene On Monoelemental Metal Substratesmentioning
confidence: 99%