This paper reviews the current status of minority carrier lifetime in n-type and p-type (Hg, Cd)Te. This review includes a discussion of the relevant (Hg, Cd)Te recombination mechanisms and measurement techniques. The reported experimentally determined lifetimes were related to (Hg, Cd)Te material iproperties of carrier concentration, Shockley-Read-Hall centres, non-uniformities ,and dislocation densities

The unusual magnetic properties of thin films of Fe 1−x Co x O y {0 x 1} ferrite solid solutions have been explained through an investigation of their electronic structure. The x-ray absorption near-edge structure (XANES) spectra of the Fe L 3 -edge and K-edges show that Co replaces Fe 3+ in the tetrahedral (T d ) sites up to x = 0.34 and octahedral (O h ) sites from 0.39 < x < 0.89. The Co L 3 -edge and O K-edge results indicate mixed valence states of Co as it replaces Fe at dissimilar sites. From the results, it is concluded that the magnetic properties of the thin films of the spinel Fe 1−x Co x O y arise from the Fe 3+ at the T d sites. The replacement of Fe 3+ and Fe 2+ by Co at the O h sites results in a crossover to the rocksalt structure and a loss of the magnetic properties.