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Textured NiO films have been grown, by thermal oxidation, on biaxially textured Ni substrates. The films have been characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and electron backscatter diffraction (EBSD). The XRD results showed two texture components, cube texture (001)[100] and (111) with out of plane orientation only. SEM showed much inhomogeneity of grain size on the sample surface. Analysis by EBSD revealed that coarse grained regions were cube textured and fine grained regions were <111> fibre textured. The ability to correlate textural and microstructural data is crucial to the optimization of textured NiO films for use in coated conductor technology.

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SUMMARY The use of a simple electronic switch to convert the video signal from a scanning electron microscope to a series of pulses is described. A multichannel pulse height analyser may then be used to perform quantitative image analysis. Examples are given showing how composition analysis, area fraction measurement and image contouring may be performed using the atomic number contrast signal from a back‐scattered electron detector. Other detector systems such as scintillators or specimen current imaging could also be used.