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Current design automation trends and methodologies are consistently improving productivity, quality, and first time success. However, these trends are directed toward digital MOS and BICMOS and not Bipolar analog/digital.Historically Bipolar analog/digital design has been neglected in the field of Design Automation because of complexity, lack of priority and cost. Recognizing the significant demand for improvements in Bipolar standard cell and semi custom analog/digital design, an integrated design environment that enables improved productivity, quality and first time success is presented.

Analog circuit design automation continues to gain attention in methods to improve, automate, and reduce design cycle time. These techniques address the needs of improving design for functionality, however the importance of design for manufacturability continues to be neglected. The emphasis of design for manufacturability is shown when the quality of a part is measured. Parts designed with no consideration for process/design variations result in poor yield. To address the need in analog design for manufacturability, new techniques that involve the areas of physical process, geometric modeling of electrical parameters, and statistical simulation techniques using independent process parameters, yield and Cpk analysis are defined and implemented. Results from these techniques provide the analog designer with the ability to simulate and predict circuit quality with process and design variations. To support the defined techniques, a design tool called MSTAT (Motorola Statistical Analysis Tool) is developed. Results of these techniques accompanied with MSTAT output is presented.

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