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Semiconductor glasses are the basic components of the integrated circuit and are responsible for the starting rapid growth of the electronic industry in the past fifty-to-sixty years worldwide. Bulk glasses of the Se 80-x Te 20 Ag x (x = 0, 5 and 10) system are prepared by the conventional melt quenching technique. Thin film, with a thickness of 300 nm is prepared by thermal evaporation technique on quartz glass. Spectral dependence of the transmittance (T) in the spectral range 300-1200 nm of glassy Se-Te-Ag is observed at various compositional variations. Optical constants i.e. refractive index (n), extinction coefficient (k), absorption coefficient (α), band gap (E g ) are calculated with and without annealing the sample at different temperatures. Computerized spectrophotometer A JASCO, V-500 UV/VIS/NIR was used for measuring the above mentioned optical constants.

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Polarized neutron reflectivity with polarization analysis enables one to determine in-plane vectorial magnetic depth profiles.We investigated the modifications of the magnetostrictive properties of nickel and nickel-iron thin films due to relaxation strains at the substrate/film and film/vacuum interfaces. The inplane magnetization rotation induced by a mechanical applied strain is shown to be non homogeneous throughout the layer. For a 100 nm iron-nickel thin film, the magnetization varies from 50° at the vacuum/film interface to 60° at the substrate(glass)/film interface. In a 40 nm nickel film, we observed that the magnetization rotation went up to 80° in the first 5 nm of the glass/nickel interface and decreased quickly to 34 ° in the rest of the layer.Other measurements were made on trilayers systems Ni/ NiFe/Ni and Ni/ Ag/NiFe in order to observe the magnetic coupling between the layers. The magnetic alloys were chosen in order to have magneto-elastic constants of opposite signs so that the rotation directions induced by a strain are perpendicular for the two alloys. The Ni/NiFe/Ni system is shown to have a rather homogeneous magnetization whereas the Ni/ Ag/NiFe trilayer exhibits magnetic rotation gradients in both layers.