We perform high-throughput density functional theory (DFT) calculations for optoelectronic properties (electronic bandgap and frequency dependent dielectric function) using the OptB88vdW functional (OPT) and the Tran-Blaha modified Becke Johnson potential (MBJ). This data is distributed publicly through JARVIS-DFT database. We used this data to evaluate the differences between these two formalisms and quantify their accuracy, comparing to experimental data whenever applicable. At present, we have 17,805 OPT and 7,358 MBJ bandgaps and dielectric functions. MBJ is found to predict better bandgaps and dielectric functions than OPT, so it can be used to improve the well-known bandgap problem of DFT in a relatively inexpensive way. The peak positions in dielectric functions obtained with OPT and MBJ are in comparable agreement with experiments. The data is available on our websites http://www.ctcms.nist.gov/~knc6/JVASP.html and https://jarvis.nist.gov.

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Abstract

An evaluation of the feasibility and the requirements associated with a facility-wide deployment of a laboratory information management system (LIMS) at an electron microscopy facility was conducted. 4CeeD, an open-source LIMS, was selected for the focus study. This report summarizes data infrastructure prerequisites, critical and desirable features, and lessons learned from using and interacting with 4CeeD, and broader LIMS adoption recommendations for this facility.