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Environmental transmission electron microscopy (ETEM) and variable-energy positron annihilation spectroscopy (VEPAS) are used to observe hydrogen-induced microstructural changes in stress-free palladium (Pd) foils and stressed Pd thin films grown on rutile TiO substrates. The microstructural changes in Pd strongly depend on the hydrogen pressure and on the stress state. At room temperature, enhanced Pd surface atom mobility and surface reconstruction is seen by ETEM already at low hydrogen pressures ( p < 10 Pa). The observations are consistent with molecular dynamics simulations. A strong increase of the vacancy density was found, and so-called superabundant vacancies were identified by VEPAS. At higher pressures, migration and vanishing of intrinsic defects is observed in Pd free-standing foils. The Pd thin films demonstrate an increased density of dislocations with increase of the H pressure. The comparison of the two studied systems demonstrates the influence of the mechanical stress on structural evolution of Pd catalysts.

We report measurements to investigate the effects of mechanical strain on the binding energy of carbon monoxide (CO) on the (111) surface of a 16 nm thin film of palladium (Pd) grown on rutile titanium dioxide (r-TiO2). The lattice mismatch between Pd and the r-TiO2 leads to a tensile mechanical in-plane stress in the Pd layer of approximately 0.38 GPa. We observe an increase of (40 ± 10) kJ mol–1 in the CO binding energy for the 16 nm sample compared to a bulk Pd(111) crystal, which is in qualitative agreement with expectations based on the d-band model.

In this paper, we demonstrate that the microstructure and the surface of a thin palladium (Pd) film can be intentionally altered by the presence of a subjacent niobium (Nb) film. Depending on the thickness of the Nb film and on the hydrogen gas pressure, defects in the Pd film can be healed or created. To demonstrate this effect, Pd/Nb/sapphire (Al 2 O 3 ) stacks are studied during hydrogen gas exposure at room temperature by using scanning tunneling microscopy (STM), X-ray diffraction (XRD) and environmental transmission electron microscopy (ETEM). STM shows that hydrogen-induced topography changes in the Nb films depend on the film thickness which affects the height of the Nb surface corrugations, their lateral size and distribution. XRD measurements show that these changes in the Nb hydride film influence the microstructure of the overlaying Pd film. ETEM reveals that the modifications of the Pd film occur due to the precipitation and growth of the Nb hydride phase. The appearance of new defects, interface and surface roughening is observed in the Pd film above locally grown Nb hydride grains. These results can open a new route to design 'smart' catalysts or membranes, which may accommodate their microstructure depending on the gaseous environment.Nano-sized metal films are widely used as a key element for hydrogen storage 1,2 , hydrogen gas sensors [3][4][5] , gas purification membranes 6, 7 and heterogeneous catalysts 8,9 . The surface morphology in such films plays an important role, especially for membrane applications and catalytic reactions, as edges and corners can work as active sites 10

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