Textured interfaces in thin-film silicon solar cells improve the efficiency by light scattering. A technique to get experimental access to the angular intensity distribution (AID) at textured interfaces of the transparent conductive oxide (TCO) and silicon is introduced. Measurements are performed on a sample with polished microcrystalline silicon layer deposited onto a rough TCO layer. The AID determined from the experiment is used to validate the AID obtained by a rigorous solution of Maxwell’s equations. Furthermore, the applicability of other theoretical approaches based on scalar scattering theory and ray tracing is discussed with respect to the solution of Maxwell’s equations.

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The angular resolved light scattering at textured back contacts for n-i-p thin-film silicon solar cells is investigated experimentally in air. These results are compared to simulations performed by a scalar model for reflection with excellent agreement. Furthermore, light scattering is modeled for the transmission and reflection inside the silicon solar cell. It is found that the reflection at the back contact dominates the light scattering in the absorber layer. From these simulations, a quantity is derived that successfully predicts the external quantum efficiencies of solar cells on different textures.

High-efficiency thin-film silicon solar cells require advanced textures at the front contacts for light management. In this contribution, the influence of the texture of various transparent conductive oxides (TCO) on the effectiveness of an intermediate reflector layer (IRL) in a-Si:H/μc-Si:H tandem solar cells is investigated. The employed front side TCOs include several types of sputter-etched ZnO:Al, LPCVD ZnO:B and APCVD SnO 2 :F. The topographies after different stages of the deposition process of the tandem solar cell, at the front TCO, after deposition of the amorphous top cell and after the deposition of the microcrystalline bottom cell, were characterized by atomic force microscopy at precisely the same spot. The external quantum efficiency of the fabricated solar cells were measured and successfully reproduced by a finite-difference time-domain method applying the measured topographies at each interface of the solar cell. With these simulations, the impact of structure type and feature size on the effectiveness of the IRL is investigated. The highest IRL effectiveness in a tandem solar cell was found for double-textured ZnO:Al. In this contribution, we study the interplay between interface textures and parasitic losses. Our findings are relevant for the design of topography for optimized IRL performance.

An aperture-type scanning near-field optical microscope (a-SNOM) is readily used for the optical and optoelectronic characterizations of a wide variety of chemical, biological and optoelectronic samples with sub-wavelength optical resolution. These samples mostly exhibit nanoscale topographic variations, which are related to local material inhomogeneity probed either by an optical contrast or by secondary effects such as photoconductivity or photoluminescence. To date, in the interpretation and evaluation of the measurement results from a-SNOM or derived methods, often only the local material inhomogeneity is taken into account. A possible influence of the optical interaction between the scanning probe and the surface topography is rarely discussed. In this paper, we present experimental and theoretical investigation of the effects of nanoscale topographic features on a-SNOM measurement results. We conduct local photocurrent measurements on a thin-film solar cell with an a-SNOM as the illumination source. A clear correlation between the photocurrent response and local topography is observed in all measurements with a signal contrast of up to ∼30%, although the sample features homogeneous permittivity and electrical properties. With the help of finite-difference time-domain (FDTD) simulations, this correlation is reproduced and local light coupling is identified as the mechanism which determines the local photocurrent response. Our results suggest that a-SNOM-based measurements of any sample with material inhomogeneity will be superimposed by the local light-coupling effect if surface topography variation exists. This effect should always be taken into consideration for an accurate interpretation of the measurement results.