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The impulse stimulated thermal scattering experimental technique is used for contactless in situ detection of phase transitions in thin nickel-titanium films deposited on silicon substrates. It is shown that this technique enables thedetermination of thelocal properties of the film over a fully coated wafer, in particular the thickness of the film and the temperature dependence of theYoung's modulus, and canthus beused for monitoring of the spatial distribution of thefunctional properties in films prepared by a combinatorial sputtering approach.

Young’s modulus of alumina particles reinforced pure Al-matrix composite is characterized by different methods: the pulse-echo ultrasound method, static three point bending, resonant bending and continuous multicycle measurement by instrumented indentation. Dependency of apparent Young’s modulus on loading amplitude was observed and attributed to the local mechanical properties of both phases, especially to the development of internal damage (local plasticity and particle cracking).