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Accurate measurement of the mechanical properties of ultra-thin films with thicknesses typically below 100 nm is a challenging issue with an interest in many fields involving coating technologies, microelectronics, and MEMS. A bilayer curvature based method is developed for the simultaneous determination of the elastic mismatch strain and Young's modulus of ultra-thin films. The idea is to deposit the film or coating on very thin cantilevers in order to amplify the curvature compared to a traditional "Stoney" wafer curvature test, hence the terminology "micro-Stoney." The data reduction is based on the comparison of the curvatures obtained for different supporting layer thicknesses. The elastic mismatch strain and Young's modulus are obtained from curvature measurements of cantilevers before and after the film deposition. The data reduction scheme relies on both analytical and finite element calculations, depending on the magnitude of the curvature. The experimental validation has been performed on ultra-thin low pressure chemical vapor deposited silicon nitride films with thickness ranging between 54 and 133 nm deposited on silicon cantilevers. The technique is sensitive to the cantilever geometry, in particular, to the thickness ratio and width/thickness ratio. Therefore, the precision in the determination of the latter quantities determines the accuracy on the extracted elastic mismatch strain and elastic modulus. The method can be potentially applied to films as thin as a few nanometers.

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