The influence of Sn doping on the crystallization and thermal stability of Ge2Sb2Te5 phase change material was studied. Thermal analysis shows that the phase change of Sn7.0Ge20.6Sb20.7Te51.7 occurs slightly higher than that of Ge2Sb2Te5 at 154 °C and has a lower melting point at 536 °C. The activation energy for crystallization for this material is also higher. It has a face-centred-cubic crystal structure. A fast crystallization speed of 60 ns is realized upon irradiation by a blue laser beam of 405 nm. The use of the Sn7.0Ge20.6Sb20.7Te51.7 phase change material as a mask layer in aperture-type super-resolution near-field phase change disk is realized to increase the carrier-to-noise ratio and thermal stability.

Effect of In and Ge doping in the form of In2Ge8Sb85Te5 on optical and thermal properties of eutectic Sb70Te30 alloys was investigated. Crystalline structure of In2Ge8Sb85Te5 phase change material consists of a mixture of phases. Thermal analysis shows higher crystallization temperature and activation energy for crystallization. Isothermal reflectivity-time measurement shows a growth-dominated crystallization mechanism. Ultrafast crystallization speed of 30ns is realized upon irradiation by blue laser beam. The use of ultrafast and thermally stable In2Ge8Sb85Te5 phase change material as mask layer in aperture-type super-resolution near-field phase change disk is realized to increase the carrier-to-noise ratio and thermal stability.

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