This paper deals with a new MRAM technology whose writing scheme relies on the Spin Orbit Torque (SOT). Compared to Spin Transfer Torque (STT) MRAM, it offers a very fast switching, a quasi-infinite endurance and improves the reliability by solving the issue of "read disturb", thanks to separate reading and writing paths. These properties allow introducing SOT at all-levels of the memory hierarchy of systems and adressing applications which could not be easily implemented by STT-MRAM. We present this emerging technology and a full design framework, allowing to design and simulate hybrid CMOS/SOT complex circuits at any level of abstraction, from device to system. The results obtained are very promising and show that this technology leads to a reduced power consumption of circuits without notable penalty in terms of performance.

Magnetic Random Access Memory (MRAM) is a very promising emerging memory technology because of its various advantages such as non-volatility, high density and scalability. In particular, Spin Orbit Torque (SOT) MRAM is gaining interest as it comes along with all the benefits of its predecessor Spin Transfer Torque (STT) MRAM, but is supposed to eliminate some of its shortcomings. Especially the split of read and write paths in SOT-MRAM promises faster access times and lower energy consumption compared to STT-MRAM. In this work, we provide a very detailed analysis of SOT-MRAM at both circuit-and architecture-level. We present a detailed evaluation of performance and energy related parameters and compare the novel SOT-MRAM with several other memory technologies. Our architecture-level analysis shows that a hybridcombination of SRAM for the L1-Data-cache, SOT-MRAM for the L1-Instruction-cache and L2-cache can reduce the energy consumption by 60 % while the performance increases by 1 % compared to an SRAM-only configuration. Moreover, the retention failure probability of SOT-MRAM is 27x smaller than the probability of radiation-induced Soft Errors in SRAM, for a 65 nm technology node. All of these advantages together make SOT-MRAM a viable choice for microprocessor caches.Index Terms-spin orbit torque, non-volatile memory, cache, hybrid, magnetic memory, reliability, failure rate 0278-0070 (c)

A process model based on the thermodynamic models of Sanchez−Lacombe and PC-SAFT EoS is developed to simulate and analyze the impact of vaporized n-hexane as an induced condensing agent on the rate of gas phase ethylene polymerization on supported catalyst. The simulation results of the process model indicate that the cosolubility phenomenon (i.e., the enhancement in the equilibrium concentration of ethylene in the amorphous phase of polyethylene in the presence of n-hexane) cannot be the sole reason for the experimentally observed increase in the polymerization rate seen over the entire duration of reaction. At the beginning, the rate of ethylene polymerization is enhanced much more strongly than would be expected simply from the cosolubility effect alone. However, as the reaction proceeds, the enhancement magnitude gradually decreases and reaches a steady-state value corresponding to the promotion magnitude in the equilibrium concentration of ethylene predicted by the two thermodynamic models.

The polymer flow model is employed to predict the transient behavior of the concentration and temperature profiles within the growing particles during gas-phase ethylene polymerization in the absence and presence of n-hexane as the induced condensing agent. It is demonstrated that by accurate estimation of the model parameters, one can precisely describe the impact of gas phase composition on the reaction rate. The simulation results show that the experimentally observed change in the polymerization rate under the various operating conditions is the direct result of alteration in the average concentration of ethylene in the particle; the average ethylene concentration not only depends on its equilibrium concentration but is also controlled by the significance of the mass transfer resistance through the growing particles. This is while the effect of partial pressure of n-hexane and ethylene on the thermal behavior of the particle is found to be insignificant for the studied experiments.

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