This paper presents a basic design and experimental results of a crack detection method on X-Ray images. The proposed method utilizes a customized algorithm wherein a section of the X-Ray image suspected to contain the irregularity, like a crack in the bone, is separated from the rest of the X-Ray image and the cropped image is altered so as to make the presence of irregularities more easily detectable. This primarily involves the detection and expansion of the irregularity in terms of size, or the number of pixels it occupies in the image. The algorithm helps isolate the irregularity and selectively dilate it, without interfering with the other parts of the image, thereby making it more easily visible to the human eye. This operation is accomplished by a Matlab supported operation called dilation. In a grayscale XRay image, the pixels constituting the image may take several intensity values. This obscures the distinction between boundaries, impeding visual diagnosis. This problem is avoided by converting the grayscale image to a binary image, creating a clear distinction between boundaries. This paper investigates the possibility of employing this approach to provide detection and selective amplification of irregularities given the region in the image in which the irregularity is suspected to lie. Then the processed image is compared with the original input image. The application of the proposed method for enhancing visual diagnosis is demonstrated by examples.

Today's world is the world of speed, convenience and accuracy. With the growing demand of consumer electronics and advancing technology, developers have numerous options available for selecting ICs for a particular application, which might also make finding appropriate IC a tedious task. Hence, a smart tool is developed which is software capable of searching appropriate IC based on selected performance determining parameters, such as CMRR, Slew rate, etc. Among different ICs, op amps are used for various purpose like in amplifiers, oscillators, filters, comparators, detectors and thus are one of the most widely used chips. This paper proposes a totally new method for smart selection of operational amplifiers. It describes the design of new software that could search a suitable IC depending upon the specifications entered by the user. The software is developed using C programming. The coding of the tool is being done on GNU environment-Dev C++, which can also be implemented with GUI.