We present the experimental study of an optical isolator with a semiconductor guiding layer that was obtained by use of a nonreciprocal phase shift. The isolator is equipped with an optical interferometer composed of tapered couplers, nonreciprocal phase shifters, and a reciprocal phase shifter. The nonreciprocal phase shifter was constructed by wafer direct bonding between the semiconductor guiding layer and the magneto-optic cladding layer. The isolator, designed for the 1.55-mum wavelength, was fabricated to investigate the characteristics of each component. By applying an external magnetic field to the nonreciprocal phase shifter, we achieved an isolation ratio of approximately 4.9 dB in the interferometric isolator.

The experimental study of an optical isolator by use of a nonreciprocal phase shift is demonstrated. The isolator has an optical interferometer composed of tapered couplers, nonreciprocal phase shifters, and a reciprocal phase shifter. The isolator, designed for a 1.55-microm wavelength, was fabricated to investigate the characteristics of each component. The branching and coupling characteristics of the tapered coupler were measured. The nonreciprocal and reciprocal phase shifts were also evaluated. By applying an external magnetic field to the interferometer, we confirmed the nonreciprocal phase shift in the interferometric isolator.

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