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Strong near surface scattering in land acquisition often prevents us from obtaining high-quality seismic data and satisfactory depth images. How small-scale heterogeneities in the near surface layer can affect the seismic data and the quality of seismic image is highly complicated. Based on the seismic resolution theory, we propose a method to analyze their relationship. We use the parameterized random media to characterize the near surface small-scale heterogeneities. Adopt the point spreading function of the image process as the generalized image, and use its amplitude and phase errors to judge the image quality. The migration process is used to relate the statistical parameters of the model and the characteristics of the resolution. Together they form a highly flexible method for investigating the shallow scattering problem. The result shows that the thickness of the random layer, the root mean square fluctuation and the correlation length all affect the quality of the image. The main purpose of this research is developing the analysis tool which can be used for investigating the shallow scattering problem and providing objective judgment for various methods proposed to mitigate the problem.

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