Design and development of the growth-process for the production of wafer-scale spatially homogeneous thickness controlled atomically thin transition metal dichalcogenides (TMDs) is one of the key challenges to realize modern electronic devices. Here, we demonstrate rapid and scalable synthesis of MoS2 films with precise thickness control via gas-phase chemical vapor deposition approach. We show that a monolayer MoS2 can be synthesized over a 2-in. sapphire wafer in a growth time as low as 4 min. With a linear growth rate of 1-layer per 4 min, MoS2 films with thicknesses varying from 1- to 5-layers with monolayer precision are produced. We propose that, in addition to Raman spectroscopy, the energy splitting of exciton bands in optical-absorbance spectra may be another choice for layer thickness identification. With suitable precursor selection, our approach can facilitate the rapid synthesis of spatially homogeneous atomically thin TMDs on a large scale.
Atomically thin MoS 2 hosts rich and distinct vibrational spectral features, which are prominent under selective excitation energies near the excitonic transitions. In this work, we have investigated the resonant Raman scattering of the MoS 2 layers of different thicknesses, from monolayer to five-layer samples, measured near resonance with the A excitonic transition. We show that the near-resonance excitation (1.96 eV) resulted in a Davydov splitting of the out-of-plane A-like phonon mode (A 1g ) around 406 cm −1 caused by the weak interlayer interaction. The number of Davydov splitting components (N) equals the number of layers (NL) of the MoS 2 , suggesting that it can be used as a thickness indicator. The origin of various Davydov components is understood based on a simple nearest-interlayer interaction. We extend our investigation to identify some acoustic phonon modes associated with characteristic second-order double-resonance Raman and disorderinduced bands.
Band gap engineering via 2D alloying is a vital strategy for three-atom-thick transition metal dichalcogenides based optoelectronics, valleytronics and nanophotonics. Here we demonstrate the growth of Mo1−xWxS2 ternary alloy monolayers and precise compositional tuning for the entire range of x from 0 to 1 using the gas-phase precursor approach. By means of Raman spectroscopy we show that W alloying in MoS2 lattice can lead to a tensile strain of ∼0.8%. The alloying-induced tensile strain plays a key role in observing redshift in optical absorption and photoluminescence (PL) bands and resulted an unusual bandgap bowing. The coupling of tensile strain and alloying effect allowed us to tune the overall PL emission energy to as large as 185 meV. Our optical spectroscopy results indicate three different phase-regions for the Mo1−xWxS2 alloy system. For x < 0.37, the alloys exhibit MoS2-like nature, whereas, WS2-like behavior is observed for x > 0.64, and a mixed behavior for 0.37 ≤ x ≤ 0.64.
A viable
solution for the large-scale production of MoS2 thin films
directly on SiO2/Si with relatively larger
growth rates is demonstrated via a gas-phase precursor-assisted chemical
vapor deposition approach. Comprehensive Raman and photoluminescence
measurements reveal the excellent spatial homogeneity and high optical
quality of the MoS2 thin films. The electrical properties
of the MoS2 layers were tested by fabricating arrays of
back-gated monolayer MoS2 field-effect transistors. Our
findings suggest that the electrical properties are influenced by
the grain size of the MoS2 monolayers.
Due to the lowest formation energies,
sulfur vacancies are inevitable
in the vapor-phase chemical vapor deposition (CVD) of MoS2, which act as deep donors and induce midgap defect states, making
the material intrinsically n-type. The postgrowth oxygen passivation
of such defects has been the subject of a large number of recent studies
because passivation of defects augments the photoluminescence quantum
yield by several orders. In this study, by introducing an SiO2/Si wafer in close proximity to the growth substrate, we were
able to supply trace oxygen in situ during the growth while simultaneously
enabling chemisorption of oxygen at defect sites on the basal plane
of large-area MoS2 monolayers. Low-temperature photoluminescence
spectroscopy allowed us to distinguish clearly the nature of oxygen
bonding in defective MoS2 grown with and without the trace
oxygen. Chemisorption of oxygen enabled elimination of defect-related
bound exciton emission at the near band edge transition of MoS2, leading to about 300% enhancement in the photoluminescence.
We observed unusual splitting of the first-order A1g Raman
mode in monolayer MoS2 films when the sulfur vacancies
are not compensated by oxygen. The present study provides new experimental
evidence to better distinguish between chemisorption and physisorption
of oxygen and may serve as an effective way to tune the optical properties
of van der Waals crystals during the large-area CVD process.
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