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For a better understanding of the physical mechanisms involved in insulators submitted to electron irradiation inside a scanning electron microscope, it is important to investigate charge trapping and detrapping. The commonly used technique to deduce the trapping ability and the motion process of electric charges is based on two complementary experimental methods: the scanning electron microscope mirror effect (SEMME) and the induced current measurement (ICM). In this paper, our study is devoted to the influence of temperature on the behavior of porcelain materials during electron injection time. To evaluate the geometry of the trapped charge distribution, a detailed analysis using the mirror image formation and its evolution is developed.