Ptychography, a special case of the phase retrieval problem, is a popular method in modern imaging. Its measurements are based on the shifts of a locally supported window function. In general, direct recovery of an object from such measurements is known to be an ill-posed problem. Although for some windows the conditioning can be controlled, for a number of important cases it is not possible, for instance for Gaussian windows. In this paper we develop a subspace completion algorithm, which enables stable reconstruction for a much wider choice of windows, including Gaussian windows. The combination with a regularization technique leads to improved conditioning and better noise robustness.

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We propose algorithms based on an optimisation method for inverse multislice ptychography in, e.g. electron microscopy. The multislice method is widely used to model the interaction between relativistic electrons and thick specimens. Since only the intensity of diffraction patterns can be recorded, the challenge in applying inverse multislice ptychography is to uniquely reconstruct the electrostatic potential in each slice up to some ambiguities. In this conceptual study, we show that a unique separation of atomic layers for simulated data is possible when considering a low acceleration voltage. We also introduce an adaptation for estimating the illuminating probe. For the sake of practical application, we finally present slice reconstructions using experimental 4D scanning transmission electron microscopy (STEM) data.