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The hydrogen atoms in the silicate Na20. SiO2.6H20 were located using neutron diffraction. The Si-O and Na-O bond lengths obtained from the refinement are compared with those given in the original X-ray structure determination, and also with the results of a completely new X-ray structure determination performed utilizing a chip from the crystal used for neutron diffraction. Some comments are made on the accuracy of the various results.

The chain structure previously reported is confirmed, but disorder in the stacking of the chains has been observed.