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Articles you may be interested inComparison of the submicron particle analysis capabilities of Auger electron spectroscopy, time-of-flight secondary ion mass spectrometry, and scanning electron microscopy with energy dispersive x-ray spectroscopy for particles deposited on silicon wafers with 1 μm thick oxide layers Comparison of submicron particle analysis by Auger electron spectroscopy, timeofflight secondary ion mass spectrometry, and secondary electron microscopy with energy dispersive xray spectroscopy A versatile spectrometer system for quantitative surface and indepth analysis with secondary ion and secondary neutral mass spectroscopy, Auger electron and xray photoelectron spectroscopy J. Vac. Sci. Technol. A 7, 3305 (1989); 10.1116/1.576141The mechanism and kinetics of the oxidation of Cr(100) singlecrystal surfaces studied by reflection highenergy electron diffraction, xray emission spectroscopy, and secondary ion mass spectrometry/Auger sputter depth profiling J. Vac. Sci. Technol. A 5, 572 (1987); 10.1116/1.574675 An Auger electron spectroscopy, xray photoelectron spectroscopy, secondary ion mass spectrometry and bulk analysis of pyrolytic boron nitride crucibles after vacuum baking Hydrogenated amorphous carbon layers (a-C:H) on silicon show substantial amounts of silicon carbide in the interface, which has been identified with x-ray photoelectron spectroscopy and Auger electron spectroscopy by comparison to Si, C, and SiC standards. The quality of such layers, in particular, adhesion and hardness, becomes better with increasing width of the depth distribution of this interfacial carbide.

The solid solution behavior of the Ni(Fe 1-n Cr n ) 2 O 4 spinel binary is investigated in the temperature range 400-1200°C. Non-ideal solution behavior, as exhibited by non-linear changes in lattice parameter with changes in n, is observed in a series of single-phase solids air-cooled from 1200°C. Air-annealing for one year at 600°C resulted in partial phase separation in a spinel binary having n = 0.5. Spinel crystals grown from NiO, The extrapolated solvus is shown to be consistent with that predicted using a primitive regular solution model in which free energies of mixing are determined entirely from changes in configurational entropy at room temperature.

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