The enhancement of the static secondary ion mass spectrometry (SIMS) signals resulting from the injection, closely to the sample surface, of H 2 O vapor at relatively high-pressure, was investigated for a set of organic materials. While the ion signals are generally improved with increasing H 2 O pressure upon 12 keV Ga ϩ bombardment, a specific enhancement of the protonated ion intensity is clearly demonstrated in each case. For instance, the presence of H 2 O vapor induces an enhancement by one order of magnitude of the [M ϩ H] ϩ static SIMS intensity for the antioxidant Irgafos 168 and a ϳ1.5-fold increase for polymers such as poly(vinyl pyrrolidone).