1990
DOI: 10.1016/0042-207x(90)94047-t
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A time-of-flight secondary ion microscope

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Cited by 97 publications
(63 citation statements)
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“…The secondary ion mass analyses were performed in a Phi-EVANS (Chanhassen, MN, USA) time-of-flight SIMS (TRIFT 1) using a 15 keV Ga ϩ beam (ϳ1 nA DC current; 22 ns pulse width bunched down to 1 ns; 5 kHz repetition rate) with the sample voltage at 3 kV [28]. To improve the measured intensities, the secondary ions were post-accelerated by a high voltage (7 kV) in front of the microchannel plate detector.…”
Section: Tof-sims Instrumentmentioning
confidence: 99%
“…The secondary ion mass analyses were performed in a Phi-EVANS (Chanhassen, MN, USA) time-of-flight SIMS (TRIFT 1) using a 15 keV Ga ϩ beam (ϳ1 nA DC current; 22 ns pulse width bunched down to 1 ns; 5 kHz repetition rate) with the sample voltage at 3 kV [28]. To improve the measured intensities, the secondary ions were post-accelerated by a high voltage (7 kV) in front of the microchannel plate detector.…”
Section: Tof-sims Instrumentmentioning
confidence: 99%
“…To characterize Sr incorporation with depth into the precipitates, time-of-flight secondary ion mass spectrometry (ToF-SIMS) analyses were performed using a Charles Evans & Associates instrument (Schueler et al, 1990), in the user facility at the Image and Chemical Analysis Laboratory at Montana State University. The solid particles were pressed into indium foil and coated with 10 nm of gold before mounting in the sample holder to prevent charging.…”
Section: Tof-sims Analysis and Determination Of Sputter Depth By Afmmentioning
confidence: 99%
“…Alternatively, the TRIFT line of SIMS mass spectrometers from Physical Electronics employ a series of three electrostatic analyzers (ESAs) along the ion flight path to account for kinetic energy differences among the ions. To compensate for the small velocity differences of individual ions, three 90° turns in the ion path function much like the reflectron described earlier by causing ions of different kinetic energy, but with the same nominal m/z, to travel slightly longer or shorter paths before reaching the detector (Schueler et al 1990;Szakal et al 2006).…”
Section: B Simsmentioning
confidence: 99%