Abstract. This research studied about effecting aging time of epoxy molding compound (EMC) that effect to reliability performance of integrated circuit (IC) package in molding process. Molding process is so important of IC packaging process for protecting IC chip (or die) from temperature and humidity environment using encapsulated EMC. For general molding process, EMC are stored in the frozen at 5°C and left at room temperature at 25 °C for aging time on self before molding of die onto lead frame is 24 hours. The aging time effect to reliability performance of IC package due to different temperature and humidity inside the package. In experiment, aging time of EMC were varied from 0 to 24 hours for molding process of SOIC-8L packages. For analysis, these packages were tested by x-ray and scanning acoustic microscope to analyze properties of EMC with an aging time and also analyzed delamination, internal void, and wire sweep inside the packages with different aging time. The results revealed that different aging time of EMC effect to properties and reliability performance of molding process. IntroductionEncapsulation of epoxy molding compound (EMC) for molding process is a popular method for integrated circuit (IC) packaging manufacturing. Molding is the process for protecting die or chip of IC package form external environment for chemical reaction and mechanical damage by shaping EMC continuing with the formation of a gelatin with complete cross linked network and leading finally to the fully cured thermoset. EMC is thermosetting polymer which is materials with cross linked polymer chains and no melting temperature after they are cured. EMC is a mixture of an epoxy resin, a filler (silica, SiO2), a hardener, and other additives. The important part of EMC which is epoxy resin functions as an adhesive and binder. For silica filler part, this part is the largest portion of EMC provides excellent mechanical strength and a thermal dispersion. Properties of these components effect to reliability performance of IC package. From normal manufacturing process, the EMC is stored in the frozen at 5 °C and aging at around room temperature before molding process. The EMC aging effect to its properties and reliability performance of IC package.Therefore, this research interested in studying effecting of aging time to epoxy molding compound (EMC) in term of reliability performance for integrated circuit (IC) package in range from 0 hour to 24 hours and analyze properties of EMC with aging time and also study about quality and reliability

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The aim of this study was to evaluate the effect of argon plasma jet, generated at atmospheric pressure, on Aspergillus sp. The molds were isolated from commercial white bread and inoculated on potato dextrose agar (PDA) containing 10% tartaric acid. The atmospheric pressure plasma jet (APPJ) was generated at a high frequency (43 kHz) power of 10, 20, or 30W and applied to the inoculated molds on PDA for 5, 10, or 20 minutes. The PDA plates were incubated for 3 and 6 days and the fungal inactivation was investigated directly under light microscope and indirectly by comparing the fungal dry weights. The results indicated that higher power supply and longer plasma exposure time led to more reduction in the fungal dry weight. The APPJ appears to be effective in destroying Aspergillus sp., yet the optimal plasma treatment condition remains to be optimized.

The granular structure of ceramic material influences the electrical properties. Ceramics of YMNO (Y2NiMnO6) doped with Nd were produced by compression and sintering. Grain size was determined from SEM image analysis. Generally, As the Nd dopant concentration was increased, the grain size increased with sintering time. However, at the highest dopant levels of 30% and 20% Nd, a large range in grain size was observed with regions of defective growth. In contrast, a more uniform grain growth was seen for the 10% Nd doped ceramic at all sintering times.

Determining the structure of ceramic materials is essential in order to fully characterize the electrical properties and improve existing materials. YMNO ceramics (Y2NiMnO6) prepared by compression and sintering were doped with TiO2 and analyzed using XRD and SEM. The calcined sample prior to sintering contained phases of the YMNO double perovskite and TiO2. Following sintering at 1400°C, the perovskite structure was replaced by Y2Ti2O7 fcc structure, and the grain size was found to increase with sintering time up to 18 hours. This sets a limit to the amount of TiO2 which can be used to successfully dope the YMNO ceramic.