We report the first experimental demonstration of an electrostatic electron orbital angular momentum (OAM) sorter, which can be used to analyze the OAM states of electrons in a transmission electron microscope. We verify the sorter functionality for several electron beams possessing different superpositions of OAM states, and use it to record the electron beams OAM spectra. Our current electrostatic OAM sorter has an OAM resolution of 2 in the units of ℏ -the reduced Planck constant. It is expected to increase the OAM resolution of the sorter to the optimal resolution of 1 in the future via fine control of the sorting phase elements.

With operando transmission electron microscopy visualizing the solid–solid electrode–electrolyte interface of silicon active particles and lithium oxide solid electrolyte as a model system, we show that (de)­lithiation (battery cycling) does not require all particles to be in direct contact with electrolytes across length scales of a few hundred nanometers. A facile lithium redistribution that occurs between interconnected active particles indicates that lithium does not necessarily become isolated in individual particles due to loss of a direct contact. Our results have implications for the design of all-solid-state battery electrodes with improved capacity retention and cyclability.

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Solving challenges of enhanced imaging (resolution or speed) is a continuously changing frontier of research. Within this sphere, ghost imaging (and the closely related single-pixel imaging) has evolved as an alternative to focal plane detector arrays owing to advances in detectors and/or modulation devices. The interest in these techniques is due to their robustness to varied sets of patterns and applicability to a broad range of wavelengths and compatibility with compressive sensing. To achieve a better control of illumination strategies, modulators of many kinds have long been available in the optical regime. However, analogous technology to control of phase and amplitude of electron beams does not exist. We approach this electron microscopy challenge from an optics perspective, with a novel approach to imaging with non-orthogonal pattern sets using ghost imaging. Assessed first in the optical regime and subsequently in electron microscopy, we present a methodology that is applicable at different spectral regions and robust to non-orthogonality. The distributed illumination pattern sets also result in a reduced peak intensity, thereby potentially reducing damage of samples during imaging. This imaging approach is potentially translatable beyond both regimes explored here, as a single-element detector system.