No abstract

This paper explores whether free recall performance and organization can be facilitated using computer-controlled interactive presentation, where stimulus presentation on Trial N+1 depends on the individual subject's prior recall history. A series of experiments investigated the effects of two types of response-contingent presentation order manipulations and of selective tagging manipulation designed to highlight the presentation of previously nonrecalled items. An initial experiment using 20-word lists showed no differences among groups, due to a ceiling effect. Two subsequent experiments, using longer lists (30 and 40 words), found that recall and subjective organization were increased by selective tagging and by presentation orders that preserved the subject's prior order of recall. The results demonstrate that subjects' previous recall histories contain information that can be used to facilitate recall. The potential of other interactive manipulations is discussed. This paper describes a series of initial experiments using an interactive free recall procedure to study memory organization and the retrieval of information from memory. In standard multitrial free recall (SFR), the learner is presented a list of items to memorize, usually in random order, one item at a time. The learner then attempts to recall as many items as possible, in any convenient order. Interactive free recall (IFR) differs from this description principally in that what is pre-

No abstract

The trend toward more intelligent instruments has become increasingly evident as vendors of test and measurement equipment take advantage of increased processing power to expand the features and functions their products provide. These include advanced data analysis and reduction, more sophisticated sequencing and control, and built-in functions targeted at specific T&M applications. This paper details how the capabilities included in the LXI (LAN eXtensions for Instrumentation) Standard enhance and accelerate the trend toward smarter instruments. It examines how the new generation of LXI smart instruments will lower the total cost of test while improving performance, increasing flexibility, and enhancing ease of use.