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As microprocessor speeds approach 1 GHz and heyond the difficulties of at-speed testing continue to increase. In particular. automated test equipment which iiperates at these frequencies is very limited. This paper discusses a design-for-test method which serializes parallel circuit inputs and de-serializes circuit outputs to achieve 1 GHz operation on test equipment operating at frequencies helow 100 MHz. This method has been used to successfully characterize the operation of a 1 GHL microprocessor chip. [I ] 0-8186-8436-4/98 $10.00 'c: 1998 IEEE 234 c dat:~ to arid tram llic deuce and i t is dso used as an cxtenial clock input to the HPX2000 rcstcr.

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