Localization of charge carriers in crystalline solids has been the subject of numerous investigations over more than half a century. Materials that show a metal-insulator transition without a structural change are therefore of interest. Mechanisms leading to metal-insulator transition include electron correlation (Mott transition) or disorder (Anderson localization), but a clear distinction is difficult. Here we report on a metal-insulator transition on increasing annealing temperature for a group of crystalline phase-change materials, where the metal-insulator transition is due to strong disorder usually associated only with amorphous solids. With pronounced disorder but weak electron correlation, these phase-change materials form an unparalleled quantum state of matter. Their universal electronic behaviour seems to be at the origin of the remarkable reproducibility of the resistance switching that is crucial to their applications in non-volatile-memory devices. Controlling the degree of disorder in crystalline phase-change materials might enable multilevel resistance states in upcoming storage devices.

Phase change materials (PCMs) can be rapidly and reversibly switched between the amorphous and crystalline state. The structural transformation is accompanied by a significant change of optical and electronic properties rendering PCMs suitable for rewritable optical data storage and non‐volatile electronic memories. The phase transformation is also accompanied by an increase of the Casimir force of 20 to 25% between gold and AIST (Ag5In5Sb60Te30) upon crystallization. Here the focus is on reproducing and understanding the observed change in Casimir force, which is shown to be related to a change of the dielectric function upon crystallization. The dielectric function changes in two separate frequency ranges: the increase of absorption in the visible range is due to resonance bonding, which is unique for the crystalline phase, while free carrier absorption is responsible for changes in the infrared regime. It is shown that free carriers contribute ≈50% to the force contrast, while the other half comes from resonance bonding. This helps to identify PCMs that maximize force contrast. Finally it is shown that if this concept of force control is to be employed in microelectromechanical devices, then protective capping layers of PCMs must be only a few nanometers thick to minimize reduction of the force contrast.

Disorder and its reduction upon annealing play a crucial role in understanding the electrical transport in the crystalline phase‐change material Ge1Sb2Te4. Previous studies focus either on the impact of disorder at moderate temperatures or on the low‐temperature properties of crystalline films with a low degree of disorder. The present investigation describes and discusses the impact of pronounced disorder on charge transport at low temperatures. The present data reveal the existence of a metal‐to‐insulator transition (MIT), where upon increasing order the zero‐temperature limit of conductivity changes from zero (insulator) to nonzero values (metal). The position of the MIT is determined with respect to the control parameter, i.e., the disorder, which is modified through the annealing conditions. Disorder is shown to localize carriers for an exceptionally large density of states. In the most disordered films, variable range hopping is observed, enabling the determination of the localization length. At the lowest temperatures studied, deviations from Mott variable range hopping are observed, which can be explained by a transition to Efros–Shklovskii hopping due to the presence of a soft Coulomb gap.

Disorder has a tremendous impact on charge transport in crystalline compounds on the pseudo-binary line between Sb 2 Te 3 and GeTe. Directly after crystallization, the pronounced disorder on the cation sublattice renders crystalline Ge 1 Sb 2 Te 4 -a composition with a carrier density of the order of 10 20 cm-an Anderson insulator. Annealing, however, induces the reduction of disorder and eventually triggers an insulator-to-metal transition. This study presents data on the electrical properties, the optical conductivity, and structural properties of the pseudo-binary compositions between Ge 3 Sb 2 Te 6 and GeTe. In contrast to the preceding investigations, which rely on the annealing temperature for tuning the electrical properties, this study elucidates the impact of stoichiometry and demonstrates that the stoichiometry may be employed as an alternative control parameter for the metal-to-insulator transition. The combination of annealing temperature and stoichiometry, therefore, provides a rich playground for tailoring disorder and, as a consequence, the transport of charge.

Many chalcogenide glasses undergo a breakdown in electronic resistance above a critical field strength. Known as threshold switching, this mechanism enables field-induced crystallization in emerging phase-change memory. Purely electronic as well as crystal nucleation assisted models have been employed to explain the electronic breakdown. Here, picosecond electric pulses are used to excite amorphous Ag_{4}In_{3}Sb_{67}Te_{26}. Field-dependent reversible changes in conductivity and pulse-driven crystallization are observed. The present results show that threshold switching can take place within the electric pulse on subpicosecond time scales-faster than crystals can nucleate. This supports purely electronic models of threshold switching and reveals potential applications as an ultrafast electronic switch.