Gibberellins (GAs) play a crucial role in growth and development of the tomato fruit. Previously published studies focusing on the effect of GAs on tomato fruits used chemical treatments, constitutive overexpression or silencing of GA biosynthetic and catabolic genes globally throughout the plant. Fruit-specific overexpression of GA catabolic enzyme genes GA2-oxidases (GA2oxs), however, may provide an alternative method to study the role of endogenous GAs on the fruit development. In this study, we have identified 11 SlGA2ox proteins in tomato that are classified into three subgroups. Motif analysis and multiple sequence alignments have demonstrated that all SlGA2oxs, except SlGA2ox10, have similar motif compositions and high-sequence conservation. Quantitative reverse transcription-PCR analysis has showed that SlGA2oxs exhibit differential expression patterns in tomato fruits at different developmental stages. When the fruit-specific promoter TFM7 was used to control the expression of SlGA2ox1, we observed no changes in growth and development of vegetative organs. However, fruit weight, seed number and germination rate were significantly affected. We also treated tomato fruits with GA biosynthesis inhibitor and observed phenotypes similar to those of the transgenic fruits. Furthermore, we have demonstrated that expression of cell expansion and GA responsive genes were downregulated in transgenic tomato fruits, supporting that overexpression of the SlGA2ox1 leads to reduction in endogenous GAs. This study provides additional evidence that endogenous GAs and the SlGA2ox1 gene play an important role in controlling on fruit weight, seed development and germination in tomato plant.

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This paper presents a comprehensive assessment of the electronic properties of an industrially grown p-type high performance multicrystalline silicon ingot. Wafers from different positions of the ingot are analysed in terms of their material quality before and after phosphorus diffusion and hydrogenation, as well as their final cell performance. In addition to lifetime measurements, we apply a recently developed technique for imaging the recombination velocity of structural defects. Our results show that phosphorus gettering benefits the intra-grain regions but also activates the grain boundaries, resulting in a reduction in the average lifetimes. Hydrogenation can significantly improve the overall lifetimes, predominantly due to its ability to passivate grain boundaries. Dislocation clusters remain strongly recombination active after all processes. It is found that the final cell efficiency coincides with the varying material quality along the ingot. Wafers toward the ingot top are more influenced by carrier recombination at dislocation clusters, whereas wafers near the bottom are more affected by a combination of their lower intra-grain lifetimes and a greater density of recombination active grain boundaries.