The magnetization process and the magnetic domains of the FeNi (100 nm)/Cu (2.5 nm)/FeNi (100 nm)/Cu (480 nm)/FeNi (100 nm)/Cu (2.5 nm)/FeNi (100 nm) structure were studied. This geometry consists of two FeNi/Cu/FeNi trilayers with a thick in the direction perpendicular to the plane of the sensitive element and narrow in the direction of the flowing current Cu electrode in the centre. Ferromagnet/conductor/ferromagnet is the typical geometry of magnetoimpedance thin-film-based sensitive elements used to detect small magnetic fields. Multilayered structures were prepared by rf-sputtering in a magnetic field of 100 Oe applied perpendicular to the Cu electrode in order to induce transverse magnetic anisotropy. The magnetic measurements and magnetic domain structure observations were made in magnetic fields applied one at a time parallel or perpendicular to the Cu electrode. Different magnetization processes with non-homogeneous rotations in the first case and dominant multiple nucleation and merging of domains in the second one were observed.

No abstract

No abstract

No abstract