A unique frequency reuse scheme by means of cell sectorization is proposed in this paper that reuses effectively a given frequency resource in a cellular environment. The key concept is to find a scheme that controls interferences among neighboring cells in a systematic manner while achieving high frequency reuse factor. Based on, user distribution in a cell, two problems are investigated. First, how to appropriately sectorize the cell such that the total received power and the total transmit power of all neighboring base stations is minimized and second is to get the most out of available frequency bandwidth. By using appropriate classification of available bandwidth into 8×4 frequency reuse plan, maximum inter-cell interference (ICI) is avoided when required signal-to-interference-plus-noise ratio (SINR) is exceeding the required amount due to required modulation and coding. Hence, the proposed system can maintain ICI always at the minimum level, in turn achieving greater spectrum reuse efficiency in comparison with classic fractional frequency reuse (FFR) and soft frequency reuse (SFR) schemes. Finally, based on extensive computer simulations it is verified that the proposed reuse scheme shows good spectrum reuse efficiency while minimizing ICI.

Abstract-In this paper, we apply the Shannon wavelet basis functions to the method of moments to evaluate the radar cross section (RCS) of the conducting and resistive surfaces. The problem is modeled by the integral equations of the first or second kind. An effective numerical method for solving these problems based on the moments method and using Shannon wavelet basis functions is proposed. The validity and accuracy of the method is checked on some examples, and the Shannon wavelets are compared with the well-known block-pulse functions (BPFs) from the viewpoint of computational efficiency. The problem of evaluating the RCS is treated in detail, and illustrative computations are given for some cases. This method can be generalized to apply to objects of arbitrary geometry and arbitrary material.

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