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A modified Michelson interferometer is described that allows calibration and measurement simultaneously. The method is used to detect displacements down to 1 nm with a time resolution of 40 nsec. These values are close to theoretical resolution limits for the experimental arrangement. The probing beam is focused onto the investigated sample, allowing measurements with a lateral resolution of 1.5 microm. The method has been applied to investigate the deformation behavior of pulsed diode lasers.

The deformation behavior of pulsed double−heterostructure diode lasers at both mirror and contact surfaces was investigated by means of an interferometric technique. The diodes, which were only supported by the pressure of a wire connection, showed at the end of a current pulse an elongation and deflection behavior. Longitudinal and flexural vibrations of the diodes were measured after the application of a single current pulse and for the flexural vibrations a resonance behavior was observed during a current pulse train.