Currently, electrical interconnections based on metal lines represent the most important limitation on the performances of silicon-based microelectronic devices. The parasitic capacities generated at the metal/insulator/metal capacitors present in the complex multilevel metallization schemes actually used, the intrinsic resistivity of the metal lines, and the contact resistance at the metal/metal interfaces constitute the main contributions to the delay in the signal propagation. Recently, a reduction of the delay times was achieved by replacing the traditional metallization schemes based on Al and SiO 2 with new materials, such as copper-based alloys and low-dielectricconstant insulating layers, but as soon as the minimum feature size of the devices will be further reduced, the delay resulting from metal interconnections will again represent an unacceptable bottleneck for device performances.[1] A definitive solution to this problem could be the use of optical interconnections for the transfer of information inside a chip or for chip-to-chip communications. To develop this strategy, siliconcompatible materials and devices able to generate, guide, amplify, switch, modulate, and detect light are needed. Recent major breakthroughs in this field have been the observation of optical gain in Si nanocrystals, [2] the development of a Si Raman laser, [3] the realization of a high-speed Si electro-optic modulator, [4] and the observation of electroluminescence from ultrapure Si diodes [5] and Si nanocrystal field-effect transistors. [6] A primary requirement for the materials proposed for the above applications is compatibility with current Si technology. However, because Si is intrinsically unable to efficiently emit light, owing to its indirect bandgap, it is evident that the main limitation to the approach described above is the lack of an efficient silicon-based light source. Among the efforts of the scientific community to efficiently produce photons from silicon, the introduction of light-emitting impurities, such as erbium ions, has a leading role. A relevant advantage of this approach is that standard silicon technology can be used to introduce erbium as a dopant and to process the material. Furthermore, Er ions emit at 1.54 lm, which is a strategic wavelength for telecommunication because it corresponds to a minimum in the loss spectrum of the silica optical fibers. Incorporation of Er in crystalline silicon (c-Si) emerged as the first promising method to turn silicon into a luminescent material, [7] but doping concentration was limited (ca. 1 × 10 18 cm -3) by the low solid solubility of Er. A co-implantation of Er and O [8,9] allowed to limit Er segregation and precipitation, owing to the formation of Er-O complexes. However, at room temperature a relatively low luminescence efficiency was obtained as a result of the strong nonradiative processes competing with the radiative Er de-excitation in c-Si. More recently, it was shown that by using a SiO 2 matrix containing Er-doped Si nanoclusters, an intense room-t...

The photon absorption in Si quantum dots (QDs) embedded in SiO2 has been systematically investigated by varying several parameters of the QD synthesis. Plasma-enhanced chemical vapor deposition (PECVD) or magnetron cosputtering (MS) have been used to deposit, upon quartz substrates, single layer, or multilayer structures of Si-rich- SiO2 (SRO) with different Si content (43-46 at. %). SRO samples have been annealed for 1 h in the 450-1250 °C range and characterized by optical absorption measurements, photoluminescence analysis, Rutherford backscattering spectrometry and x-ray Photoelectron Spectroscopy. After annealing up to 900 °C SRO films grown by MS show a higher absorption coefficient and a lower optical bandgap (∼2.0 eV) in comparison with that of PECVD samples, due to the lower density of Si-Si bonds and to the presence of nitrogen in PECVD materials. By increasing the Si content a reduction in the optical bandgap has been recorded, pointing out the role of Si-Si bonds density in the absorption process in small amorphous Si QDs. Both the photon absorption probability and energy threshold in amorphous Si QDs are higher than in bulk amorphous Si, evidencing a quantum confinement effect. For temperatures higher than 900 °C both the materials show an increase in the optical bandgap due to the amorphous-crystalline transition of the Si QDs. Fixed the SRO stoichiometry, no difference in the optical bandgap trend of multilayer or single layer structures is evidenced. These data can be profitably used to better implement Si QDs for future PV technologies. © 2009 American Institute of Physics

The structural properties and the room temperature luminescence of Er2O3 thin films deposited by magnetron sputtering have been studied. In spite of the well-known high reactivity of rare earth oxides towards silicon, films characterized by good morphological properties have been obtained by using a SiO2 interlayer between the film and the silicon substrate. The evolution of the properties of the Er2O3 films due to thermal annealing processes in oxygen ambient performed at temperatures in the range of 800–1200°C has been investigated in detail. The existence of well defined annealing conditions (rapid treatments at a temperature of 1100°C or higher) allowing to avoid the occurrence of extensive chemical reactions with the oxidized substrate has been demonstrated; under these conditions, the thermal process has a beneficial effect on both structural and optical properties of the film, and an increase of the photoluminescence (PL) intensity by about a factor of 40 with respect to the as-deposited material has been observed. The enhanced efficiency of the photon emission process has been correlated with the longer lifetime of the PL signal. Finally, the conditions leading to a reaction of Er2O3 with the substrate have been also identified, and evidences about the formation of silicate-like phases have been collected.

Strongly enhanced light emission at wavelengths between 1.3 and 1.6 μm is reported at room temperature in silicon photonic crystal (PhC) nanocavities with optimized out-coupling efficiency. Sharp peaks corresponding to the resonant modes of PhC nanocavities dominate the broad sub-bandgap emission from optically active defects in the crystalline Si membrane. We measure a 300-fold enhancement of the emission from the PhC nanocavity due to a combination of far-field enhancement and the Purcell effect. The cavity enhanced emission has a very weak temperature dependence, namely less than a factor of 2 reduction between 10 K and room temperature, which makes this approach suitable for the realization of efficient light sources as well as providing a quick and easy tool for the broadband optical characterization of silicon-on-insulator nanostructures.