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For the first time the measurement technique is developed for dielectric loss in the low loss materials at the long-wave part of the millimeter range of electromagnetic waves on the basis of compact open semi-symmetric confocal resonator for the samples with arbitrary ratio of the sample thickness and wavelength in the dielectric material. The loss in the aluminum oxide ceramics (Al 2 O 3) of the brand VK-99 was measured at room temperature at the frequency 69.4 GHz: tanδ = 3.110 4. This value is close to the corresponding value in the aluminium oxide ceramics Al 2 O 3 of the Russian production of the brand VK100M, and it is lower than in the corresponding ceramics of the Chinese production [5]. In addition, this value is close to the loss in the single crystal of Al 2 O 3 (sapphire). This indicates a very high quality of the modern Russian ceramics of aluminum oxide.

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