The flat-panel-display (FPD) market is experiencing rapid growth due to increased demand for portable computers, communication equipment, and consumer electronic products. In all of these applications, the display is the primary human interface that conveys information. The size of the flat-panel-display market is presently estimated to be $10 billion/year and is projected to grow to over $18 billion/year by 1998. Although most current FPDs utilize either passive- or active-matrix liquid-crystal-display (LCD) technology, electroluminescent (EL) displays and light sources, because of their solid-state construction and self-emissive characteristics, can provide improved performance for many demanding display applications. Thin-film electroluminescent (TFEL) technology has been demonstrated over a broad range of display sizes from 1-in. to 18-in. diagonal with resolutions from 50 to 1,000 lines per inch. Also, because of its unique solid-state characteristic, TFEL technology is well-suited to provide a fully integrated display with the light-emitting element and electronics fabricated on the same substrate. An example of a full-color TFEL display is shown in Figure 1.Thin-film electroluminescent display panels are finding increasing applications in the FPD marketplace due to several fundamental performance advantages over LCDs. These include wide viewing angle, high contrast, wide operating-temperature range, ruggedness, and long lifetime. Alternating-current (ac)-driven monochrome TFEL displays (ACTFEL displays) have become the most reliable, longest running devices on the market. Commercial ACTFEL display panels have operated for more than 50,000 hours with less than 10% luminance change, the equivalent of 25 working years.
Thin films of cerium-activated alkaline earth thiogallate were investigated for the fabrication of blue-emitting thinfilm electroluminescent (TFEL) devices. The films were prepared by RF sputtering from targets with composition: MI_~Ga2S4:Ce=, where M = Ba, Ca, St, and 0.01 -< x -< 0.1. Photoluminescent (PL) emission spectra showed matching peak wavelengths to those obtained from electroluminescent (EL) emission for each alkaline earth thiogallate film. The optimum cerium concentration for EL emission intensity for strontium and calcium thiogallate films was determined to be x = 0.04 and 0.06, respectively. The EL brightness measured for the calcium thiogallate devices was almost twice that measured for the strontium thiogallate devices. This brightness variation, however, is due mainly to the difference in the lumen equivalent of the emission intensity. The cerium concentration dependence of the PL emission spectra of the thiogallate films is substantially decreased compared with the respective powder material suggesting inhomogeneous cerium incorporation in the films. ) unless CC License in place (see abstract). ecsdl.org/site/terms_use address. Redistribution subject to ECS terms of use (see 128.171.57.189 Downloaded on 2015-06-14 to IP
The compound Nb14S5 has been prepared by high-temperature techniques. The crystal structure of Nb14S5 has been determined from a single-crystal X-ray diffraction study using intensities obtained on a single-crystal diffractometer with Mo Ka radiation. The compound crystallizes in the orthorhombic space group Pnma with unit cell dimensions a = 18.480 ±l,b = 3.374 + 2, and c = 19.797 ± 16 A. The unit cell contains four formula units. The positional parameters were refined by least-squares treatment using isotropic thermal parameters to a conventional R = 0.079. The sulfur atoms have capped trigonal-prismatic coordination. The coordination number of the niobium atoms ranges between 14 and 16.
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