Neutron reflectivity experiments on the interface of pure D2O against thin films of perdeuterated polystyrene (d-PS) spin-coated onto silicon blocks were performed to study the intrinsic structure of the interface of water against hydrophobic substrates. The experiments reveal nonvanishing scattering contrast at the polymer/water interface, although the two materials (d-PS and D2O) have closely similar scattering length densities. Organic (nondeuterated) contaminants or macroscopic air bubbles trapped at the polymer/water interface can be ruled out as the origin of this observation. From a systematic study of this system, it is concluded that the source of the nonvanishing contrast is a depletion of water in the boundary layer against the hydrophobic surface. It is conjectured that this depletion layer represents a precursor layer of submicroscopic gas bubbles recently observed by Tyrrell and Attard. The existence of such gas nanobubbles in the present system is confirmed by atomic force microscopy (AFM) of the surface of d-PS coatings in contact with bulk water. The thickness of the precursor gas layer as determined by neutron reflectometry is 2−5 nm, depending on the level of air saturation of the water sample and on the time elapsed after contacting it with the hydrophobic surface.

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The sequential adsorption of oppositely charged polyelectrolytes called the "layer by layer" technique is a method for formation of ultrathin films with controlled thickness and interfacial properties. Composition of polyelectrolyte solutions, pH, and electrolyte concentration are important parameters governing formation of multilayer films. Since pH is the factor controlling charge of weak polyelectrolytes, the structure of multilayers should be sensitive to its value. In this paper we focused on formation of PE multilayer films composed from weak and strong polyelectrolytes. We used weak, branched polycation polyethyleneimine (PEI, 70 kDa) and strong polyanion poly-4-styrenesulfonate (PSS, 70 kDa) to form films by the layer-by-layer technique on the surface of silicon wafers under two deposition conditions: pH = 6 when PEI was strongly charged and pH = 10.5 when the charge density of PEI was low. Thicknesses of films were measured by single wavelength ellipsometry, and the results were confronted with ones concerning mass of the adsorbed films obtained by quartz crystal microbalance. We found that, depending on pH of the solutions, combination of weakly and strongly charged polyelectrolytes gave either linear or nonmonotonic increase of film thickness with a number of deposited PE layers. We observed a good correlation between multilayer film thickness and adsorbed mass. The atomic force microscopy images of surface topography of PEI/PSS films demonstrated large differences between films deposited at pH = 6 and 10.5. Additionally the cyclic voltamperometry was used to determine the differences in permeability of films formed at various pH conditions.