The introduction of ferromagnetism in MoS2 is important for its applications in semiconductor spintronics. MoS2 powders were synthesized by hydrothermal method, followed by the N plasma treatment at room temperature. Weak ferromagnetism with saturated ferromagnetic magnetization of 0.64 memu/g has been observed in the as-synthesized MoS2 at room temperature, which is significant enhanced to 3.67 memu/g after the N plasma treatment for the proper duration. X-ray photoelectron spectroscopy demonstrates the adsorption of N, and higher valence state of Mo than +4 due to the bonding with N after the N plasma treatment. First principle calculation has been performed to disclose the possible origin of ferromagnetism. One chemical adsorbed N ion on S ion may form conjugated π bonds with adjacent two Mo ions to have a total magnetic moment of 0.75 μB, contributing to the enhanced ferromagnetism.
Electric field control of exchange bias (EB) plays an important role in spintronics due to its attractive merit of lower energy consumption. Here, we propose a novel method for electrically tunable EB at room temperature in a device with the stack of Si/SiO 2 /Ta/Pt/Ag/Mn-doped ZnO (MZO)/Pt/FeMn/ Co/ITO by resistive switching (RS) via electrochemical metallization (ECM). The device shows enhanced and weakened EB when set at high-resistance state (HRS) and low-resistance state (LRS), respectively. For the device at LRS, the aberrationcorrected scanning transmission electron microscopy (STEM) characterizations unambiguously reveal that the Ag filaments grow initially from the Ag anode and then elongate toward the ITO cathode. It is inferred that at LRS, a small portion of Ag filaments have passed through the MZO and the intervening thin Pt layer and extended into the FeMn layer. After applying reverse voltage, these Ag filaments are electrochemically dissolved and ruptured near the MZO/Pt interface. This is considered to be the main mechanism responsible for RS and switchable EB as well. This work presents a new strategy for designing low-power, nonvolatile magnetoelectric random access memory devices.
Amorphous CoFeB lms grown on GaAs(001) substrates demonstrating signi cant in-plane uniaxial magnetic anisotropy were investigated by vector network analyzer ferromagnetic resonance. Distinct in-plane anisotropy of magnetic damping, with a largest maximum-minimum damping ratio of about 109%, was observed via analyzing the frequency dependence of linewidth in a linear manner. As the CoFeB lm thickness increases from 3.5 nm to 30 nm, the amorphous structure for all the CoFeB lms is maintained while the magnetic damping anisotropy decreases signi cantly. In order to reveal the inherent mechanism responsible for the anisotropic magnetic damping, studies on time-resolved magneto-optical Kerr effect and high resolution transmission electron microscopy were performed. Those results indicate that the in-plane angular dependent anisotropic damping mainly originates from two-magnon scattering, while the Gilbert damping keeps almost unchanged.
Two types of electric control of exchange bias (EB) by resistive switching (RS), i.e. conductive-filament-RS (type I) and interface-barrier-RS (type II) were observed in the Si/SiO2Ti/Pt/FeOx/Co/ITO multilayer devices, which were fabricated by magnetron sputtering. It is difficult for the type I device to control EB, which may be due to that the quantity of conductive filaments is not enough to modify the antiferromagnetic structure of FeOx near the Co/FeOx interface. However, the electric control of EB can be accomplished in the type II device. Compared with low-resistance-state (LRS), the exchange bias field (HE) increases a little but the coercivity (HC) increases significantly at high-resistance-state (HRS). We consider that the migration of the oxygen vacancies under different voltages is able to mediate the interfacial barrier height, leading to the bipolar RS effect and the change of EB as well. This provides a way for designing new types of spintronic devices based on electric control.
The structural and magnetic properties are important parameters for spintronic applications of Heusler compounds. The Co2FeAl and CoFe2Al alloys are considered as the representatives of the regular and inverse Heusler structure, respectively. Here, we present a systematic study of the structural and magnetic properties of Co3-xFexAl (x = 1 ~ 2) Heusler thin films grown on MgO (001) substrates. The lattice parameters and magnetic properties, such as magnetic coercivity, saturated moment and four-fold magnetic anisotropy constant, display different change trends in the Co-rich and Fe-rich regions, which suggest that magnetic properties have relevance to the Heusler structures. Our findings give a better understanding of the Heusler structures and magnetic properties, which is helpful for developing spintronic applications.
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