Polyimide (PI, Kapton-H®) films are widely utilized in the spacecraft industry for their insulating properties, mechanical durability, light weight, and chemical resistance to radiation. Still PI materials remain exposed to a combination of high-energy electrons, protons, and ultraviolet (UV) photons, particles primarily responsible for radiation-induced damage in geosynchronous Earth orbit (GEO), which drastically change PI’s properties. This work reviews the effect of electron, proton, and UV photon irradiation on the material properties (morphology, absorption, mechanical properties, and charge transport) of PI. The different damaging mechanisms and chemical consequences that drive changes in the material properties of PI caused by each individual kind of irradiation will be discussed in detail.

Abstract-Electron-induced electron yields of high-resistivity, high-yield materials -ceramic polycrystalline aluminum oxide and the polymer polyimide (Kapton HN), -were made by using a low-fluence, pulsed incident electron beam and charge neutralization electron source to minimize charge accumulation. Large changes in energy-dependent total yield curves and yield decay curves were observed, even for incident electron fluences of <3 fC/mm 2 . The evolution of the electron yield as charge accumulates in the material is modeled in terms of electron recapture based on an extended Chung-Everhart model of the electron emission spectrum. This model is used to explain anomalies measured in highly insulating, high-yield materials, and to provide a method for determining the limiting yield spectra of uncharged dielectrics. Relevance of these results to spacecraft charging is also discussed.

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Modest changes in spacecraft charging conditions can lead to abrupt changes in the spacecraft equilibrium, from small positive potentials to large negative potentials relative to the space plasma; this phenomenon is referred to as threshold charging. It is well known that temporal changes of the space plasma environment (electron plasma temperature or density) can cause threshold charging. Threshold charging can also result from by temporal changes in the juxtaposition of the spacecraft to the environment, including spacecraft orbit, orientation, and geometry. This study focuses on the effects of possible changes in electron emission properties of representative spacecraft materials. It is found that for electron-induced emission, the possible threshold scenarios are very rich, since this type of electron emission can cause either positive or negative charging. Alternately, modification of photon-or ion-induced electron emission is found to induce threshold charging only in certain favorable cases. Changes of emission properties discussed include modifications due to: contamination, degradation and roughening of surfaces and layered materials; biasing and charge accumulation; bandstructure occupation and density of states caused by heat, optical or particle radiation; optical reflectivity and absorptivity; and inaccuracies and errors in measurements and parameterization of materials properties. An established method is used here to quantitatively gauge the relative extent to which these various changes in electron emission alter a spacecraft's charging behavior and possibly lead to threshold charging. The absolute charging behavior of a hypothetical flat, twodimensional satellite panel of a single material (either polycrystalline conductor Au or the polymeric polyimide Kapton™ H) is modeled as it undergoes modification and concomitant changes in spacecraft charging in three representative geosynchronous orbit environments, from full sunlight to full shade (eclipse) are considered.

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