The thermal conductivity of SiO2 thin films prepared using various procedures has been studied using a 3ω method. The thermal conductivity of SiO2 thin films of above approximately 500 nm thickness decreases as the porosity of the specimen, which is determined by infrared absorption spectroscopy, increases. Below approximately 250 nm thickness, the observed thermal conductivity of the SiO2 thin films systematically decreases as a function of film thickness. The data have been analyzed based on a SiO2-thickness-independent thermal conductivity and interfacial resistance. The total estimated interfacial resistance between the metal strip and the film, and between the film and the substrate is about 2×10−8 m2 KW−1.
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Vapor pressures for 50 hydrofluoroethers have been measured from pressures of less than 30 kPa to 101.3 kPa. Measurements were made by the isoteniscope method. The Antoine constants for each compound were derived using the experimental data.
Analysis of ac temperature wave during the measurement of thermal diffusivity of twolayered platelike samples An ac calorimetric method is applied to the direct measurement of thermal diffusivity of single fibers. Theoretical analysis is presented, taking into account the two-dimensional ac thermal wave for cylindrical systems and the effect of time delay at the temperature detecting system. Experimental tests are performed using nickel and stainless steel wires about 20 m in diameter. The thermal conductivity of fibers about 10 m in diameter of the advanced materials, polyacrylonitrile-based carbon, TORAYCA, and aramide, Kevlar, is determined. The relationship between the thermal conductivity and electric conductivity and the crystalline size of these fibers is discussed. For composite materials made of carbon fibers, the observed thermal conductivity agrees with the thermal conductivity estimated using the values determined by the present method.
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