An effective silicon debug technique uses a trace buffer to monitor and capture a portion of the circuit response during its functional, post-silicon operation. Due to the limited space of the available trace buffer, selection of the critical trace signals plays an important role in both minimizing the number of signals traced and maximizing the observability/restorability of other untraced signals during post-silicon validation. This paper presents a new method for trace buffer signal selection for the purpose of post-silicon debug. The selection is performed by favoring those signals with the most number of implications that are not implied by other signals. Then, based on the values of the traced signals during silicon debug, we introduce an algorithm which uses a SAT-based multi-node implication engine to restore the values of untraced signals across multiple time-frames.Experimental results for sequential benchmark circuits showed that the proposed approach selects the trace signals effectively, giving a high restoration percentage compared with other techniques.

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