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：Parameter identification of fractional-order chaotic power systems is a multidimensional optimization problem that plays a decisive role in the synchronization and control of fractional-order chaotic power systems. In this paper, a state transition algorithm based on the lens imaging learning strategy is proposed for parameter identification of fractional-order chaotic power systems. Taking a fractional-order six-dimensional chaotic power system mathematical model as an example, the mathematical model and chaotic state are analyzed. First, the Tent chaotic mapping is used to initialize the population, thus increasing population diversity. The randomness and ergodicity of the Tent chaotic sequence are used to enhance the global searching ability of the algorithm. Second, a maturity index is employed to determine population maturity. The lens imaging learning strategy is used to suppress the premature convergence of the state transition algorithm effectively and help the population jump out of local optima. Finally, the improved state transition algorithm is used to identify the parameters of the fractional-order six-dimensional chaotic power system model. The proposed improved state transition algorithm shows high estimation accuracy and convergence speed, and is superior to the traditional state transition and particle swarm optimization algorithms. The simulation results show that the parameters of the fractional-order chaotic power system are identified accurately even in the presence of white noise, demonstrating the strong robustness and versatility of the proposed algorithm.

Based on the semiconductor equipment data acquisition standard, this paper analyzes the communication method between the fabrication client applications and the equipments. The common equipment model and the method of self-description of equipment nodes based on metadata are firstly studied in this paper, and then we research the security authentication and authorization mechanism between equipments and fabrication client applications. A method for client acquisiting semiconductor equipments data timely and flexible is given by SEMI EDA, which improves the ability of fabrication client applications to collect equipment data.